Patents by Inventor Chih-Yi Lai

Chih-Yi Lai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240071981
    Abstract: A method of fabricating a semiconductor structure includes the following steps. A semiconductor wafer is provided. A plurality of first surface mount components and a plurality of second surface mount components are bonded onto the semiconductor wafer, wherein a first portion of each of the second surface mount components is overhanging a periphery of the semiconductor wafer. A first barrier structure is formed in between the second surface mount components and the semiconductor wafer. An underfill structure is formed under a second portion of each of the second surface mount components, wherein the first barrier structure blocks the spreading of the underfill structure from the second portion to the first portion.
    Type: Application
    Filed: November 1, 2023
    Publication date: February 29, 2024
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Mao-Yen Chang, Chih-Wei Lin, Hao-Yi Tsai, Kuo-Lung Pan, Chun-Cheng Lin, Tin-Hao Kuo, Yu-Chia Lai, Chih-Hsuan Tai
  • Publication number: 20130147870
    Abstract: A printing method for three-dimensional painting by UV digital printing device has acts of: First, preparing a printing device having a white print set and a color print set. Second, moving the printing device transversely from one side to the other side of an object for multiple times, wherein the two print sets respectively print on two adjacent zones. Third, moving the printing device longitudinally to next zone on the object. Fourth, repeating the second and third acts until the printing device moves over a last zone on the object. The printing device moves longitudinally after the printing device moves transversely to and fro to finish the height of a zone. Thus, the printing device completes all the heights and the colors in one time of longitudinal moving. Then printing consumes less time and the printing device therefore does not have to be orientated again.
    Type: Application
    Filed: December 13, 2011
    Publication date: June 13, 2013
    Applicants: DIGITAL PHOTONICS CORPORATION, ANDERSON INDUSTRIAL CORP.
    Inventors: Awen YEH, Kai LIU, Jim LIU, Chen-Ying CHENG, Chih-Yi LAI, Mao-Feng TU
  • Patent number: 7731318
    Abstract: A pneumatic ink-jet system is applied in an inkjet printer and uses a negative pressure generator, which is designed according to the Bernoulli's Theory, with a stable airflow in a certain speed to generated stable pressure inside at least one inkpot and at least one print head. Therefore, the at least one print head is kept in an appropriate wet state and the quality of printing is enhanced. Moreover, a top surface of the ink inside the at least one inkpot can be controlled to be higher than the at least one print head, so the pneumatic ink-jet system can be applied in a large format inkjet printer.
    Type: Grant
    Filed: February 28, 2008
    Date of Patent: June 8, 2010
    Assignee: Digital Photonics Corporation
    Inventors: Chi-Shi Liu, Chih-Yi Lai, Chun-Ying Cheng
  • Publication number: 20090219350
    Abstract: A pneumatic ink-jet system is applied in an inkjet printer and uses a negative pressure generator, which is designed according to the Bernoulli's Theory, with a stable airflow in a certain speed to generated stable pressure inside at least one inkpot and at least one print head. Therefore, the at least one print head is kept in an appropriate wet state and the quality of printing is enhanced. Moreover, a top surface of the ink inside the at least one inkpot can be controlled to be higher than the at least one print head, so the pneumatic ink-jet system can be applied in a large format inkjet printer.
    Type: Application
    Filed: February 28, 2008
    Publication date: September 3, 2009
    Applicant: DIGITAL PHOTONICS CORPORATION
    Inventors: Chi-Shi LIU, Chih-Yi LAI, Chun-Ying CHENG
  • Patent number: 7359763
    Abstract: A cutting tool adjustment method includes lowering a cutting tool on a transparent Mylar to produce an indentation before an actual scribing operation; picking up the image of the indentation; using a numerical analysis method and a set formula to automatically calculate a correction angle and position so as to adjust the angle and position of the cutting tool subject to the calculation result; and repeating the calculation and adjustment procedures, if necessary.
    Type: Grant
    Filed: December 14, 2004
    Date of Patent: April 15, 2008
    Assignee: Industrial Technology Research Institute
    Inventors: Kuei-Jung Chen, Sin-Len Tan, Chih-Yi Lai, Meng-Chun Chen
  • Publication number: 20060036337
    Abstract: A cutting tool adjustment method is disclosed to lower a cutting tool on a transparent Mylar to produce an indentation before actual scribing operation, and then to pick up the image of the indentation, and then to use a numerical analysis method and the set formula to automatically calculate the correction angle and position and to adjust the angle and position of the cutting tool subject to the calculation result, and then to repeat the calculation and adjustment procedure if necessary. Thus, the cutting tool and its cutting edge can be accurately adjusted to the correct angle and position to obtain a precise indentation. Further, by means of the automatic adjustment procedure, the present invention saves much adjusting time, thereby improving the productivity.
    Type: Application
    Filed: December 14, 2004
    Publication date: February 16, 2006
    Inventors: Kuei-Jung Chen, Sin-Len Tan, Chih-Yi Lai, Meng-Chun Chen
  • Patent number: 6932259
    Abstract: A brittle material breaking apparatus using a lifting mechanism to lift/lower a carrier wherein the lifting mechanism is controlled to lift the carrier for holding the brittle material for breaking, and then to lower the carrier from the brittle material to a distance for enabling the brittle material to be shifted to a next scribe line for further breaking, preventing the occurrence of friction between the brittle material and the carrier and the production of static electricity and micro particles and, improving the breaking quality. The brittle material breaking apparatus further includes a stroke fine adjustment mechanism adapted to adjust the stroke of the breaking-cutter relative to the brittle material.
    Type: Grant
    Filed: February 23, 2004
    Date of Patent: August 23, 2005
    Assignee: Industrial Technology Research Institute
    Inventors: Kuei-Jung Chen, Meng-Chun Chen, Chih-Ming Chen, Chih-Yi Lai
  • Publication number: 20050121486
    Abstract: A brittle material breaking apparatus using a lifting mechanism to lift/lower a carrier wherein the lifting mechanism is controlled to lift the carrier for holding the brittle material for breaking, and then to lower the carrier from the brittle material to a distance for enabling the brittle material to be shifted to a next scribe line for further breaking, preventing the occurrence of friction between the brittle material and the carrier and the production of static electricity and micro particles and, improving the breaking quality. The brittle material breaking apparatus further includes a stroke fine adjustment mechanism adapted to adjust the stroke of the breaking-cutter relative to the brittle material.
    Type: Application
    Filed: February 23, 2004
    Publication date: June 9, 2005
    Inventors: Kuei-Jung Chen, Meng-Chun Chen, Chih-Ming Chen, Chih-Yi Lai
  • Patent number: 6871115
    Abstract: The integrity of control signals used to control a wafer handling robot is monitored by a monitor connected to various points of the robotic control system. The monitor includes a memory for storing data sets representing correct, reference characteristics of the control signals. The monitor samples control signals at various points in the control system and compares these sampled signals with the stored reference characteristics in order to determine whether a signal disparity exists. If a disparity exists, the monitor generates an error.
    Type: Grant
    Filed: October 11, 2002
    Date of Patent: March 22, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Kuo-Liang Huang, Enzo Kuo, Patrick Chen, Yuan-Chich Lin, Chih-Yi Lai, Chun-Hung Liu
  • Patent number: 6782883
    Abstract: A cutting device for breaking fragile materials is constructed to include a lifting mechanism adapted to move the cutter vertically, a rotary table adapted to control the cutting angle of the cutter on the workpiece, a feed mechanism adapted to control the federate of the cutter, and a rotary mechanism adapted to rotate the cutter for enabling the cutter to cut the workpiece with one of multiple cutting points thereof selectively.
    Type: Grant
    Filed: February 5, 2003
    Date of Patent: August 31, 2004
    Assignee: Industrial Technology Research Institute
    Inventors: Kuei-Jung Chen, Meng-Chun Chen, Chih-Yi Lai
  • Publication number: 20040094010
    Abstract: A cutting device for breaking fragile materials is constructed to include a lifting mechanism adapted to move the cutter vertically, a rotary table adapted to control the cutting angle of the cutter on the workpiece, a feed mechanism adapted to control the federate of the cutter, and a rotary mechanism adapted to rotate the cutter for enabling the cutter to cut the workpiece with one of multiple cutting points thereof selectively.
    Type: Application
    Filed: February 5, 2003
    Publication date: May 20, 2004
    Inventors: Kuei-Jung Chen, Meng-Chun Chen, Chih-Yi Lai
  • Publication number: 20040073336
    Abstract: The integrity of control signals used to control a wafer handling robot is monitored by a monitor connected to various points of the robotic control system. The monitor includes a memory for storing data sets representing correct, reference characteristics of the control signals. The monitor samples control signals at various points in the control system and compares these sampled signals with the stored reference characteristics in order to determine whether a signal disparity exists. If a disparity exists, the monitor generates an error.
    Type: Application
    Filed: October 11, 2002
    Publication date: April 15, 2004
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Kuo-Liang Huang, Enzo Kuo, Patrick Chen, Yuan-Chich Lin, Chih-Yi Lai, Chun-Hung Liu
  • Patent number: 6348943
    Abstract: A digital non-contact blade position detection apparatus is provided for use on a wafer dicing machine for blade position detection so as to correct the position of the cutting blade.
    Type: Grant
    Filed: October 30, 1998
    Date of Patent: February 19, 2002
    Assignees: Industrial Technology Research Institute, Yang Iron Works Co., Ltd.
    Inventors: Chien-Rong Huang, Chih-Yi Lai, Chien-Hsing Lin, Chun-Hung Liu