Patents by Inventor Chii-Wen Chen

Chii-Wen Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6917117
    Abstract: A method of mounting flip-chip for lowering the on-resistance of power transistor in the protection circuit of rechargeable battery, which comprises a power field effect transistor and a protection IC, has the following steps: first, serially connect drain metal contacts of two transistors to form a chip cell during fabrication of wafer; then, use welding torch to point weld the metal wire on contact of each chip cell, so that the source and gate contacts will form welding metal bumps respectively; cut the wafer to form bare chip cells of two serially connected gate electrodes; stain said chip cell with tin so that said welding metal bumps on contacts are attached with tin balls; apply plastic material to positioned points of printed circuit board; use flip-chip technology to make drain of a bare chip cell face upward, so that said tin balls are aligned with the positioned points of printed circuit board; finally, passing through an oven for heating and pressuring, so that said tin balls will fuse and said pl
    Type: Grant
    Filed: July 23, 2003
    Date of Patent: July 12, 2005
    Assignee: Chino-Excel Technologies, Corp.
    Inventors: Feng-Tso Chien, Chii-Wen Chen, Kou-Way Tu, Zheng-Feng Lin
  • Publication number: 20040070081
    Abstract: A method of mounting flip-chip for lowering the on-resistance of power transistor in the protection circuit of rechargeable battery, which comprises a power field effect transistor and a protection IC, has the following steps: first, serially connect drain metal contacts of two transistors to form a chip cell during fabrication of wafer; then, use welding torch to point weld the metal wire on contact of each chip cell, so that the source and gate contacts will form welding metal bumps respectively; cut the wafer to form bare chip cells of two serially connected gate electrodes; stain said chip cell with tin so that said welding metal bumps on contacts are attached with tin balls; apply plastic material to positioned points of printed circuit board; use flip-chip technology to make drain of a bare chip cell face upward, so that said tin balls are aligned with the positioned points of printed circuit board; finally, passing through an oven for heating and pressuring, so that said tin balls will fuse and said pl
    Type: Application
    Filed: July 23, 2003
    Publication date: April 15, 2004
    Applicant: Chino-Excel Technologies Corp.
    Inventors: Feng-Tso Chien, Chii-Wen Chen, Kou-Way Tu, Zheng-Feng Lin
  • Publication number: 20020117994
    Abstract: A method of mounting flip-chip for lowering the on-resistance of power transistor in the protection circuit of rechargeable battery, which comprises a power field effect transistor and a protection IC, has the following steps: first, serially connect drain metal contacts of two transistors to form a chip cell during fabrication of wafer; then, use welding torch to point weld the metal wire on contact of each chip cell, so that the source and gate contacts will form welding metal bumps respectively; cut the wafer to form bare chip cells of two serially connected gate electrodes; stain said chip cell with tin so that said welding metal bumps on contacts are attached with tin balls; apply plastic material to positioned points of printed circuit board; use flip-chip technology to make drain of a bare chip cell face upward, so that said tin balls are aligned with the positioned points of printed circuit board; finally, passing through an oven for heating and pressuring, so that said tin balls will fuse and said pl
    Type: Application
    Filed: December 10, 2001
    Publication date: August 29, 2002
    Inventors: Feng-Tso Chien, Chii-Wen Chen, Kou-Way Tu, Zheng-Feng Lin
  • Patent number: 5656546
    Abstract: A self-aligned TiN/TiSi.sub.2 formation using N.sub.2.sup.+ implantation during a two-step annealing Ti-salicidation process is provided. The leakage currents of n.sup.+ /p junction diodes fabricated using this technology were measured to investigate the phenomena of Al spiking into Si-substrate. The measured reverse-bias leakage current of diode per unit junction area with Al/TiN/TiSi.sub.2 contact is 1.2 nA/cm.sup.2 at -5 Volts, which is less than all of reported data. Also it can sustain the annealing process for 30 min at 500.degree. C. Thus, TiN formed with this technology process provides an effective barrier layer between TiSi.sub.2 and Al for submicron CMOS technology applications.
    Type: Grant
    Filed: August 28, 1995
    Date of Patent: August 12, 1997
    Assignee: Taiwan Semiconductor Manufacturing Company Ltd
    Inventors: Chii-Wen Chen, Mong-Song Liang