Patents by Inventor Chikaaki Yamaguchi

Chikaaki Yamaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5596712
    Abstract: A computer-implemented method and system for diagnosing and system for diagnosing and analyzing fault information of a product is carried out by (a) creating a fault tree representing causal relations between faults and causes thereof base on information of past faults and information concerning the structure and characteristics of the product, and storing the fault tree in a storage unit, the fault tree having branches allocated with weighting coefficients; (b) inputting new fault information of the product into the computer; (c) searching the fault tree in accordance with the weighting coefficients based on the fault information stored in the storage unit to thereby determine the cause of the fault; (d) generating and outputting information concerning an adjustment or repair of the product suffering from the fault based on the determined cause of the fault as well as the information concerning the structure and the characteristics of the product; (e) supplying information concerning the timing of the occurr
    Type: Grant
    Filed: July 8, 1992
    Date of Patent: January 21, 1997
    Assignee: Hitachi, Ltd.
    Inventors: Tsutomu Tsuyama, Shigeru Sato, Kayo Tsunekawa, Sadao Shimoyashiro, Toshimasa Harada, Koichi Higano, Toshio Namiki, Chikaaki Yamaguchi, Mitsuzo Morito
  • Patent number: 5245554
    Abstract: An integrated quality control method and system for explaining failure causes of a product. Information relating to failure of the product and measures taken to correct the failure as well as information relation to manufacture and distribution of the product are collected and inputted for storage in a data base. The information relating to the failure and measures taken to correct the failure is combined with the information relating to the manufacture and distribution of the product and the combined information is analyzed for enabling an estimate of causes of the failure of the product and a trend of possible failures.
    Type: Grant
    Filed: March 19, 1991
    Date of Patent: September 14, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Tsutomu Tsuyama, Toshimasa Harada, Sadao Shimoyashiro, Koichi Higano, Toshio Namiki, Chikaaki Yamaguchi, Kozo Izui