Patents by Inventor Chikara NAKAMURA

Chikara NAKAMURA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • VISUAL FIELD TESTING METHOD, VISUAL FIELD TESTING DEVICE, AND VISUAL FIELD TESTING PROGRAM
    Publication number: 20240122465
    Abstract: A visual field testing method is a visual field testing method of testing a visual field range divided into at least a first partial area and a second partial area, the method including: a step of measuring sensitivities of a plural first test points that are included in the first partial area: and a step of performing a process of estimating sensitivities of a plural second test points that are included in the first partial area and are test points other than the first test points, by using the sensitivities of the plural first test points.
    Type: Application
    Filed: December 13, 2023
    Publication date: April 18, 2024
    Applicant: NIKON CORPORATION
    Inventors: Chikara NAKAMURA, Taishi AOKI, Teruo HORIKAWA, Hisao OSAWA