Patents by Inventor Chikuya Takada

Chikuya Takada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for managing liquid crystal substrate
    Patent number: 7702486
    Abstract: A liquid crystal substrate managing apparatus comprises a data management section with a database for recording a defect information acquired from a liquid crystal testing device, and an image information and a repair information acquired from a liquid crystal repair device. The data management section performs the reidentification of a defect and/or the redetermination of a panel and/or a substrate based on the defect information, the image information and the repair information recorded in the database.
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: April 20, 2010
    Assignee: Shimadzu Corporation
    Inventors: Tadayuki Fujiwara, Chikuya Takada
  • TFT array inspection device
    Patent number: 7298163
    Abstract: A TFT array inspection device inspects a TFT array substrate having thin film transistors arranged in a matrix pattern. The TFT array inspection device includes a probe frame to be electrically connected to the TFT array substrate. The probe frame includes probe pins contacting array inspection electrodes to be connected to a driving electrode terminal provided in a TFT array on the TFT array substrate through wires. The probe pins are positioned at common locations relative to a layout of the TFT array substrate. Since the probe pins are located at common positions, it is possible to use a single common probe frame for the TFT array substrate with a different layout without providing or changing a prove frame corresponding to a different layout of the TFT array substrate.
    Type: Grant
    Filed: April 30, 2004
    Date of Patent: November 20, 2007
    Assignee: Shimadzu Corporation
    Inventor: Chikuya Takada
  • TFT array inspection device
    Publication number: 20040246018
    Abstract: A TFT array inspection device inspects a TFT array substrate having thin film transistors arranged in a matrix pattern. The TFT array inspection device includes a probe frame to be electrically connected to the TFT array substrate. The probe frame includes probe pins contacting array inspection electrodes to be connected to a driving electrode terminal provided in a TFT array on the TFT array substrate through wires. The probe pins are positioned at common locations relative to a layout of the TFT array substrate. Since the probe pins are located at common positions, it is possible to use a single common probe frame for the TFT array substrate with a different layout without providing or changing a prove frame corresponding to a different layout of the TFT array substrate.
    Type: Application
    Filed: April 30, 2004
    Publication date: December 9, 2004
    Applicant: SHIMADZU CORPORATION
    Inventor: Chikuya Takada
  • Apparatus and method for managing liquid crystal substrate
    Publication number: 20040164762
    Abstract: A liquid crystal substrate managing apparatus comprises a data management section with a database for recording a defect information acquired from a liquid crystal testing device, and an image information and a repair information acquired from a liquid crystal repair device. The data management section performs the reidentification of a defect and/or the redetermination of a panel and/or a substrate based on the defect information, the image information and the repair information recorded in the database.
    Type: Application
    Filed: February 20, 2004
    Publication date: August 26, 2004
    Applicant: SHIMADZU CORPORATION
    Inventors: Tadayuki Fujiwara, Chikuya Takada