Abstract: An on-chip capacitor having a plurality of capacitor layers. Each capacitor layer includes a pair of frames. A first frame of the pair is electrically connected to first frames on each other capacitor layer and a second frame of the pair is electrically connected to second frames on each other capacitor layer. A plurality of tines project from each frame within the respective capacitor layer. The tines from each frame mesh so as to form an array of sequentially alternating tines from each frame to provide a layer capacitance within the capacitor layer. The multi-layer capacitor further includes a plurality of projections from the tines. The projections extend between frames of adjacent capacitor layers so as to provide an interstitial capacitance between the capacitor layers. The total capacitance of the on-chip capacitor is the sum of each layer capacitance and each interstitial capacitance.

Abstract: A method for monitoring the depth of at least one via (11) in a wafer including the steps of arranging the via (11) as a capacitive plate (21), providing a corresponding capacitive plate (23), applying an electrical potential difference to the via (11) and the corresponding capacitive plate (23), measuring the resultant capacitance between the via (11) and a corresponding capacitive plate (23) and determining the depth of the at least one via (11) by the capacitance.