Patents by Inventor Chin-Kun HUANG

Chin-Kun HUANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11528473
    Abstract: An automatic test method for testing functions of a device under test is disclosed. The automatic test method includes the following operations. A sample video is generated based on first sample photos and at least one second sample photo by a processor. The sample video is displayed by the device under test and test photos are generated based on the content of the displayed sample video captured by a camera. The first sample photos are compared with the test photos to generate a display compared result. A display error message or a display pass message is generated based on the display compared result by the processor, configured to indicate that whether a display function of the device under test is dysfunctional.
    Type: Grant
    Filed: December 3, 2020
    Date of Patent: December 13, 2022
    Assignee: AmTRAN Technology Co., Ltd.
    Inventors: Chin-Kun Huang, Yu-Ruei Li, Peng-Ta Chiu
  • Patent number: 11489750
    Abstract: An automatic test device is disclosed. The automatic test device is includes connection ports, a processor, and a transmission integrated interface. The connection ports is configured to couple to a device under test. The processor is coupled to the connection ports and is configured to transmit a test instruction through the connection ports to the device under test. The device under test is in a test mode after receiving the test instruction, and the first processor is configured to receive a test signal transmitted through the connection ports from the device under test when the device under test is in the test mode. The transmission integrated interface is coupled between the connection ports and the processor, and is configured to transmit at least one of the test instructions to the connection ports or the processor. An automatic test system is also disclosed herein.
    Type: Grant
    Filed: December 3, 2020
    Date of Patent: November 1, 2022
    Assignee: AmTRAN Technology Co., Ltd.
    Inventors: Chin-Kun Huang, Yu-Ruei Li, Peng-Ta Chiu
  • Publication number: 20210176459
    Abstract: An automatic test method for testing functions of a device under test is disclosed. The automatic test method includes the following operations. A sample video is generated based on first sample photos and at least one second sample photo by a processor. The sample video is displayed by the device under test and test photos are generated based on the content of the displayed sample video captured by a camera. The first sample photos are compared with the test photos to generate a display compared result. A display error message or a display pass message is generated based on the display compared result by the processor, configured to indicate that whether a display function of the device under test is dysfunctional.
    Type: Application
    Filed: December 3, 2020
    Publication date: June 10, 2021
    Inventors: Chin-Kun HUANG, Yu-Ruei LI, Peng-Ta CHIU
  • Publication number: 20210176157
    Abstract: An automatic test device is disclosed. The automatic test device is includes connection ports, a processor, and a transmission integrated interface. The connection ports is configured to couple to a device under test. The processor is coupled to the connection ports and is configured to transmit a test instruction through the connection ports to the device under test. The device under test is in a test mode after receiving the test instruction, and the first processor is configured to receive a test signal transmitted through the connection ports from the device under test when the device under test is in the test mode. The transmission integrated interface is coupled between the connection ports and the processor, and is configured to transmit at least one of the test instructions to the connection ports or the processor. An automatic test system is also disclosed herein.
    Type: Application
    Filed: December 3, 2020
    Publication date: June 10, 2021
    Inventors: Chin-Kun HUANG, Yu-Ruei LI, Peng-Ta CHIU