Patents by Inventor Chin Tsair Chen

Chin Tsair Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD FOR ANALYZING IC DEVICES AND WAFERS
    Publication number: 20090206870
    Abstract: A method for analyzing Integrated circuit (IC) devices is provided.
    Type: Application
    Filed: August 8, 2008
    Publication date: August 20, 2009
    Inventors: MENG YU HUANG, Tsai Li Lee, Chin Tsair Chen, Ming Hsieh Tsai
  • TESTING MODEL
    Publication number: 20070294072
    Abstract: The invention is directed to a method for testing a chip, wherein the chip comprises a plurality of devices. The method comprises steps of screening out at least one questionable device within the chip by applying a testing model on each of the devices with a normal operating factor set and then applying the testing model on each questionable device with a plurality of operating testing factor sets so as to verify a failure cause of the chip on each questionable device.
    Type: Application
    Filed: June 16, 2006
    Publication date: December 20, 2007
    Inventors: Ming-Shiahn Tsai, Chin-Tsair Chen