Patents by Inventor Chin Won Cho

Chin Won Cho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7032157
    Abstract: A method for optimizing UDMA transfer signals parameter that functions independently of a computer system is provided. The method of the invention utilizes UDMA CRC errors to adjust an optimized UDMA transfer signal parameter. A total error rate is logged for each selected parameter for determining the parameter with the lowest total error rate. The method functions continuously, to provide reduced CRC error generation and data corruption, and enhanced UDMA transfer signal integrity.
    Type: Grant
    Filed: March 17, 2003
    Date of Patent: April 18, 2006
    Assignee: Samsung Electronics, Co., Ltd.
    Inventors: Gyu-Taek Kim, Young Dug Jung, Yeong Kyun Lee, Chin Won Cho
  • Patent number: 6954322
    Abstract: The invention provides a method insuring that each read channel optimization step is controllable in terms of quality divergence, that a systematic response can be made which can be readily automated. The method is applicable to a pre-existing read channel optimization (RCO) script. The method includes the following operations. Acquiring a first quality measure and a first parameter list. Performing the pre-existing RCO script creating a second quality measure and a second parameter list based upon the first parameter list. Convergence processing the first and second quality measures and parameter lists.
    Type: Grant
    Filed: February 27, 2003
    Date of Patent: October 11, 2005
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jong Yun Yun, Chin Won Cho, Hu Yul Bang, Jae June Kim
  • Patent number: 6828784
    Abstract: Methods and apparatus are disclosed determining the presence of base line popping noise for a read head inside an assembled disk drive, as well as, determining read bias conditions for operating the read head free of base line popping noise. These further include performance evaluation of the read head for read bias conditions free of base line popping noise. They also include repairing the read head using DC write current and read bias current within the assembled disk drive.
    Type: Grant
    Filed: August 22, 2002
    Date of Patent: December 7, 2004
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jong Yun Yun, Jae June Kim, Chin Won Cho, Chang Dong Yeo
  • Publication number: 20040187067
    Abstract: A method for optimizing UDMA transfer signals parameter that functions independently of a computer system is provided. The method of the invention utilizes UDMA CRC errors to adjust an optimized UDMA transfer signal parameter. A total error rate is logged for each selected parameter for determining the parameter with the lowest total error rate. The method functions continuously, to provide reduced CRC error generation and data corruption, and enhanced UDMA transfer signal integrity.
    Type: Application
    Filed: March 17, 2003
    Publication date: September 23, 2004
    Inventors: Gyu-Taek Kim, Young Dug Jung, Yeong Kyun Lee, Chin Won Cho
  • Publication number: 20040169947
    Abstract: The invention provides a method insuring that each read channel optimization step is controllable in terms of quality divergence, that a systematic response can be made which can be readily automated. The method is applicable to a pre-existing read channel optimization (RCO) script. The method includes the following operations. Acquiring a first quality measure and a first parameter list. Performing the pre-existing RCO script creating a second quality measure and a second parameter list based upon the first parameter list. Convergence processing the first and second quality measures and parameter lists.
    Type: Application
    Filed: February 27, 2003
    Publication date: September 2, 2004
    Inventors: Jong Yun Yun, Chin Won Cho, Hu Yul Bang, Jae June Kim
  • Publication number: 20030151403
    Abstract: The invention includes methods determining the presence of base line popping noise for a read head inside an assembled disk drive, as well as, determining read bias conditions for operating the read head free of base line popping noise. The invention further includes performance evaluation of the read head for read bias conditions free of base line popping noise. The invention also includes repairing the read head using DC write current and read bias current within the assembled disk drive.
    Type: Application
    Filed: August 22, 2002
    Publication date: August 14, 2003
    Inventors: Jong Yun Yun, Jae June Kim, Chin Won Cho, Chang Dong Yeo