Abstract: The present disclosure discloses an inspection device and an inspection method. The inspection device includes a first light source, a second light source, a light source controller and a sensor. The light source controller is configured to enable the first light source to irradiate an object under inspection in a first period of an inspection phase, and to enable the second light source to irradiate the object under inspection in a second period of the inspection phase. The sensor continuously senses the reflected light of the object under inspection in an exposure period of the inspection phase so as to obtain image data of the object under inspection. The exposure period includes the first period and the second period.

Abstract: A method and device of inspecting a surface of an interconnect structure are provided. The interconnect structure includes a first metal layer, second metal layer, and dielectric layer enclosing the second metal layer. The first metal layer and dielectric layer are disposed above the second metal layer. At least one portion of the first metal layer is exposed from the surface of the interconnect structure. The method includes: illuminating a surface of an interconnect structure by an incident light having a first polarization state; receiving light signals reflected from the interconnect structure and having a second polarization state different from the first polarization state; and determining a planar pattern of the first metal layer by differentiating between at least one light signal reflected from the first metal layer and at least one light signal reflected from the second metal layer according to intensity differences between the light signals.

Abstract: An image calibration method for imaging system is provided, including: specifying a detection area located in an image capture scope and the detection area having a unit to be tested; capturing a detection image respectively when the detection area is located in at least two locations within the image capture scope; combining the plurality of detection images and calculating to obtain a calibration figure; and applying the calibration figure to a captured image to complete the calibration. In this way, the calibration figure that adapt to the luminescent type and size of the unit to be tested can be obtained.

Abstract: A method for defect inspection of a transparent substrate comprises (a) providing an optical system for performing a diffraction process of object wave passing through a transparent substrate, (b) interfering and wavefront recording for the diffracted object wave and a reference wave to reconstruct the defect complex images (including amplitude and phase) of the transparent substrate, (c) characteristics analyzing, features classifying and sieving for the defect complex images of the transparent substrate, and (d) creating defect complex images database based-on the defect complex images for comparison and detection of the defect complex images of the transparent substrate.

Abstract: A method for defect inspection of a transparent substrate comprises (a) providing an optical system for performing a diffraction process of object wave passing through a transparent substrate, (b) interfering and wavefront recording for the diffracted object wave and a reference wave to reconstruct the defect complex images (including amplitude and phase) of the transparent substrate, (c) characteristics analyzing, features classifying and sieving for the defect complex images of the transparent substrate, and (d) creating defect complex images database based-on the defect complex images for comparison and detection of the defect complex images of the transparent substrate.

Abstract: The present invention provides a series of derivatives of stilbenoid which are useful as new inhibitory agents against head and neck squamous cell carcinoma (HNSCC) and hepatoma.

Abstract: The present invention provides a series of derivatives of stilbenoid which are useful as new inhibitory agents against head and neck squamous cell carcinoma (HNSCC) and hepatoma.

Abstract: A magnetic clip for ear acupuncture points comprises a first clip body and a second clip body. An insulation cap is provided on one side of the first clip body, and then a first magnetic body is accommodated between the first clip body and the insulation cap. The second clip body is provided with a second magnetic body. The first magnetic body and the second magnetic body are coupled with lead wires respectively which in turn are both connected to an electric stimulator. The first magnetic body and the second magnetic body can sandwich the ear to be treated between them by magnetic force which is used simultaneously to conduct magnetic therapy on ear acupuncture points. The electric stimulator can also send electric current to the magnetic bodies through the lead wires, so as to conduct electric therapy via the stimulating probe.