Patents by Inventor Ching-Hong HSIEH

Ching-Hong HSIEH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240077890
    Abstract: The present disclosure generally relates to methods and system used to collect waste fluids. A system controller is disclosed to control the operation of at least a portion of the system. The controller has a CPU. The fabrication facility includes a first processing system having fluid dispensed therein for processing a material on a part. A first drain is configured to collect the processing fluid as waste fluid after processing the part. The fabrication facility also includes a waste collection system fluidly coupled to the system drain. The waste collection system has two or more valves configured to couple the system drain and two or more facility drains. Each facility drain is uniquely coupled to one of the two or more valves. The CPU is configured to operate the valves between an open and a closed state in response to the fluid entering the system drain.
    Type: Application
    Filed: September 1, 2022
    Publication date: March 7, 2024
    Inventors: Maxime CAYER, John L. KOENIG, Tony H. TONG, Shaun W. CRAWFORD, James L'HEUREUX, Andreas NEUBER, Ching-Hong HSIEH
  • Patent number: 10942507
    Abstract: A method includes determining, by a processing device, a first eco-efficiency characterization associated with a first design of manufacturing equipment based on one or more of water eco-efficiency characterization, emissions eco-efficiency characterization, or electrical energy eco-efficiency characterization. The water eco-efficiency characterization, the emissions eco-efficiency characterization, the electrical energy eco-efficiency characterization, and the first eco-efficiency characterization are associated with an amount of environmental impact generated by the manufacturing equipment per unit product produced by the manufacturing equipment. The method further includes comparing the first eco-efficiency characterization to a second eco-efficiency characterization that is associated with a second design of the manufacturing equipment.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: March 9, 2021
    Assignee: Applied Materials, Inc.
    Inventors: Mark Robert Denome, Vijayakumar Venugopal, Ashish Kumar, Vijai Thangamany, Somil Kapdia, Ching-Hong Hsieh
  • Publication number: 20190155265
    Abstract: A method includes determining, by a processing device, a first eco-efficiency characterization associated with a first design of manufacturing equipment based on one or more of water eco-efficiency characterization, emissions eco-efficiency characterization, or electrical energy eco-efficiency characterization. The water eco-efficiency characterization, the emissions eco-efficiency characterization, the electrical energy eco-efficiency characterization, and the first eco-efficiency characterization are associated with an amount of environmental impact generated by the manufacturing equipment per unit product produced by the manufacturing equipment. The method further includes comparing the first eco-efficiency characterization to a second eco-efficiency characterization that is associated with a second design of the manufacturing equipment.
    Type: Application
    Filed: January 18, 2019
    Publication date: May 23, 2019
    Inventors: Mark Robert DENOME, Vijayakumar VENUGOPAL, Ashish KUMAR, Vijai THANGAMANY, Somil KAPDIA, Ching-Hong HSIEH
  • Patent number: 10185313
    Abstract: A method for wafer point by point analysis includes receiving a selection of manufacturing equipment, utility use data, and utilization data. A water eco-efficiency characterization is calculated based on the utilization data and the utility use data. An emissions eco-efficiency characterization is calculated based on the utilization data and the utility use data. An electrical energy eco-efficiency characterization is calculated based on the utilization data and the utility use data. A combined eco-efficiency characterization is calculated based on the utilization data and water eco-efficiency characterization, emissions eco-efficiency characterization, and electrical energy eco-efficiency characterizations. The combined eco-efficiency characterization is provided for display by a graphical user interface.
    Type: Grant
    Filed: April 20, 2016
    Date of Patent: January 22, 2019
    Assignee: Applied Materials, Inc.
    Inventors: Mark Robert Denome, Vijayakumar Venugopal, Ashish Kumar, Vijai Thangamany, Somil Kapadia, Ching-Hong Hsieh
  • Publication number: 20170308071
    Abstract: A method for wafer point by point analysis includes receiving a selection of manufacturing equipment, utility use data, and utilization data. A water eco-efficiency characterization is calculated based on the utilization data and the utility use data. An emissions eco-efficiency characterization is calculated based on the utilization data and the utility use data. An electrical energy eco-efficiency characterization is calculated based on the utilization data and the utility use data. A combined eco-efficiency characterization is calculated based on the utilization data and water eco-efficiency characterization, emissions eco-efficiency characterization, and electrical energy eco-efficiency characterizations. The combined eco-efficiency characterization is provided for display by a graphical user interface.
    Type: Application
    Filed: April 20, 2016
    Publication date: October 26, 2017
    Inventors: Mark Robert DENOME, Vijayakumar VENUGOPAL, Ashish KUMAR, Vijai THANGAMANY, Somil KAPADIA, Ching-Hong HSIEH