Abstract: Run-time logic built-in self-test (LBIST) may be performed, while ensuring operational continuity. The compute elements in a machine learning accelerator contain LBIST circuitry that performs logic testing of the functional circuitry in the compute element. The LBIST circuitry may be self-sufficient, meaning that it contains the data and instructions needed to run and evaluate these tests. An LBIST manager enables the logic testing during idle time of the functional circuitry between blocks of statically scheduled instructions. As a result, the LBIST circuitry can perform the logic tests without disrupting the computation of the machine learning network.

Abstract: An image sensor includes a first imaging pixel for a first color having a photosensitive region disposed within a substrate of the image sensor and a second imaging pixel for a second color that is different from the first color having a photosensitive region disposed within the substrate. A refraction element disposed adjacent to the substrate, so that the refraction element refracts light of the first color to the photosensitive region of the first imaging pixel and refracts light of the second color to the photosensitive region of the second imaging pixel.

Abstract: An image sensor includes a first imaging pixel for a first color having a photosensitive region disposed within a substrate of the image sensor and a second imaging pixel for a second color that is different from the first color having a photosensitive region disposed within the substrate. A refraction element disposed adjacent to the substrate, so that the refraction element refracts light of the first color to the photosensitive region of the first imaging pixel and refracts light of the second color to the photosensitive region of the second imaging pixel.

Abstract: A system and method for applying a layer of material in the image sensor fabrication process in order to increase the absorption of specific range light spectrum by the image sensor is described. The mechanism adopted is by converting light rays from higher energy range (shorter wavelength) to lower energy range (longer wavelength) such that the light absorption by the image sensor can be increased.

Abstract: A system and method for applying a layer of material in the image sensor fabrication process in order to increase the absorption of specific range light spectrum by the image sensor is described. The mechanism adopted is by converting light rays from higher energy range (shorter wavelength) to lower energy range (longer wavelength) such that the light absorption by the image sensor can be increased.