Patents by Inventor Ching-ju Jennifer Young

Ching-ju Jennifer Young has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6320186
    Abstract: Improved methods of calculating offset correction values for detector elements of an infrared detector array. The methods can be used for one-dimensional scanning arrays, and performed twice for two-dimensional staring arrays. (FIGS. 3 and 6). The array is dithered so that two or more neighboring detector elements of the array look at the same location of a scene. (FIG. 3, Step 302). Then, two fields of pixel data are processed to calculate an offset correction value for each detector element. (FIG. 3, Steps 305, 309, and 311). For each detector element, its offset error is calculated from local averages, with the local average for a particular detector element including a term for that detector element as well as terms for a neighboring detector element. A “one-step” method uses the sum of “shifted image differences” from two fields. A “scene term” may be added to each offset correction value to compensate for dither bias.
    Type: Grant
    Filed: July 2, 1999
    Date of Patent: November 20, 2001
    Assignee: Raytheon Company
    Inventors: Ching-ju Jennifer Young, Kent McCormack, Larry A. Turner
  • Patent number: 6184527
    Abstract: Methods of calculating gain correction values and offset correction values for detector elements of an infrared detector array, under “abnormal” conditions, such as when the scene is in motion or when-there is dither bias. The methods can be adapted for one-dimensional scanning arrays or for two-dimensional staring arrays. (FIGS. 3 and 6). The array is mechanically dithered so that two or more neighboring detector elements of the array look at the same location of a scene. (FIG. 3, Step 302; FIG. 6, Step 601). Then, the fields of pixel data are processed to calculate a gain correction value and an offset correction value for each detector element. (FIG. 3, Steps 305, 309, and 311; FIG. 6, Steps 603, 607, and 611). For each detector element, its gain error and its offset error are calculated from local averages, with the local average for a particular detector element including a term for that detector element as well as terms for its neighboring detector elements.
    Type: Grant
    Filed: August 26, 1997
    Date of Patent: February 6, 2001
    Assignee: Raytheon Company
    Inventor: Ching-ju Jennifer Young
  • Patent number: 5925880
    Abstract: Methods of calculating gain correction values and offset correction values for detector elements of an infrared detector array. The methods can be adapted for one-dimensional scanning arrays or for two-dimensional staring arrays. (FIGS. 3 and 6). The array is mechanically dithered so that two or more neighboring detector elements of the array look at the same location of a scene. (FIG. 3, Step 302; FIG. 6, Step 601). Then, the fields of pixel data are processed to calculate a gain correction value and an offset correction value for each detector element. (FIG. 3, Steps 305, 309, and 311; FIG. 6, Steps 603, 607, and 611). For each detector element, its gain error and its offset error are calculated from local averages, with the local average for a particular detector element including a term for that detector element as well as terms for its neighboring detector elements.
    Type: Grant
    Filed: August 22, 1997
    Date of Patent: July 20, 1999
    Assignee: Raytheon Company
    Inventors: Ching-ju Jennifer Young, Robert C. Gibbons, A-Lan Reynolds