Abstract: Glass-based articles comprise stress profiles providing improved fracture resistance. The glass-based articles herein provide high fracture resistance after multiple drops.

Abstract: A process tube device can detect the presence of any external materials that may reside within a fluid flowing in the tube. The process tube device detects the external materials in-situ which obviates the need for a separate inspection device to inspect the surface of a wafer after applying fluid on the surface of the wafer. The process tube device utilizes at least two methods of detecting the presence of external materials. The first is the direct measurement method in which a light detecting sensor is used. The second is the indirect measurement method in which a sensor utilizing the principles of Doppler shift is used. Here, contrary to the first method that at least partially used reflected or refracted light, the second method uses a Doppler shift sensor to detect the presence of the external material by measuring the velocity of the fluid flowing in the tube.

Abstract: A glass composition includes from 55.0 mol % to 75.0 mol % SiO2; from 8.0 mol % to 20.0 mol % Al2O3; from 3.0 mol % to 15.0 mol % Li2O; from 5.0 mol % to 15.0 mol % Na2O; and less than or equal to 1.5 mol % K2O. The glass composition has the following relationships: Al2O3+Li2O is greater than 22.5 mol %, R2O+RO is greater than or equal to 18.0 mol %, R2O/Al2O3 is greater than or equal to 1.06, SiO2+Al2O3+B2O3+P2O5 is greater than or equal to 78.0 mol %, and (SiO2+Al2O3+B2O3+P2O5)/Li2O is greater than or equal to 8.0. The glass composition may be used in a glass article or a consumer electronic product.

Abstract: A glass-based assembly includes a glass or glass-ceramic substrate comprising a surface. The surface has flaws, such as a population of small cracks extending into the surface, whereby the substrate is weakened relative to ideal strength thereof. The assembly further includes a coating coupled to the substrate and overlaying at least some of the flaws. Ultimate strength of the substrate with the coating coupled thereto is greater than that of the substrate alone, without the coating.

Abstract: A glass composition includes: from 50 mol % to 70 mol % SiO2; from 15 mol % to 30 mol % Al2O3; from 5 mol % to 20 mol % Na2O; from 0 mol % to 15 mol % MgO; and from 0 mol % to 15 mol % CaO. The glass composition is free or substantially free of Li (i.e., Li2O). The sum of MgO and CaO in the glass composition may be from 0 mol % to 30 mol %.

Abstract: An arterial pulse wave measurement system and a pulse wave measurement method are provided. The system includes a first sensor, a pressurizing element, and a processing device. The first sensor is arranged on the radial artery to detect a pulse wave amplitude of a radial artery. The pressurizing element contacts the first sensor to pressurize the first sensor. The processing device is coupled to the first sensor and the pressurizing element so as to control the first sensor to continuously detect the pulse wave amplitude and control the pressurizing element to continuously pressurize. When the processing device confirms that the pulse wave amplitude starts to decrease, the processing device controls the pressurizing element to depressurize until the pulse wave amplitude returns to a maximum amplitude pulse wave and records the pulse wave waveform of the radial artery under a constant pressure.

Abstract: In a method of inspection of a semiconductor substrate a first beam of light is split into two or more second beams of light. The two or more second beams of light are respectively transmitted onto a first set of two or more first locations on top of the semiconductor substrate. In response to the transmitted two or more second beams of light, two or more reflected beams of light from the first set of two or more first locations are received. The received two or more reflected beams of light are detected to generate two or more detected signals. The two or more detected signals are analyzed to determine whether a defect exists at the set of the two or more first locations.

Abstract: In a method of inspection of a semiconductor substrate a first beam of light is split into two or more second beams of light. The two or more second beams of light are respectively transmitted onto a first set of two or more first locations on top of the semiconductor substrate. In response to the transmitted two or more second beams of light, two or more reflected beams of light from the first set of two or more first locations are received. The received two or more reflected beams of light are detected to generate two or more detected signals. The two or more detected signals are analyzed to determine whether a defect exists at the set of the two or more first locations.

Abstract: A physiological signal measurement apparatus, including a base seat, an air-bladder device, a plurality of pressure sensors, and a plurality of elastomers, is provided. The air-bladder device is disposed on the base seat and includes a plurality of sub air-bladders. The pressure sensors are respectively disposed on the sub air-bladders. The elastomers are respectively disposed between the sub air-bladders and the pressure sensors.

Abstract: An opaque gahnite-spinel glass ceramic is provided. The glass ceramic includes a first crystal phase including (MgxZn1-x)Al2O4 where x is less than 1 and a second crystal phase includes at least one of tetragonal ZrO2, MgTa2O6, mullite, and cordierite. The glass ceramic has a Young's modulus greater than or equal to 90 GPa, and has a hardness greater than or equal to 7.5 GPa. The glass ceramic may be ion exchanged. Methods for producing the glass ceramic are also provided.

Abstract: Glass-based articles comprise stress profiles providing improved fracture resistance. The glass-based articles herein provide high fracture resistance after multiple drops.

Abstract: A composition includes: 30 mol % to 60 mol % SiO2; 15 mol % to 35 mol % Al2O3; 5 mol % to 25 mol % Y2O3; 0 mol % to 20 mol % TiO2; and 0 mol % to 25 mol % R2O, such that R2O is the sum of Na2O, K2O, Li2O, Rb2O, and Cs2O.

Abstract: Glass-based articles comprise stress profiles providing improved fracture resistance. The glass-based articles herein provide high fracture resistance after multiple drops.

Abstract: A crimping hand tool, including a first clamp body and a second clamp body pivotally connected to each other, a driving member, a crimping assembly, and a cable stripping assembly, is provided. The driving member is movably disposed in the second clamp body, with one end pivotally connected to the first clamp body, and another end pivotally connected to the crimping assembly that is movably disposed in the second clamp body. The cable stripping assembly is movably disposed in the second clamp body and is pivotally connected to the crimping assembly. A pivotal axial direction of the first clamp body and the second clamp body, a pivotal axial direction of the driving member and the first clamp body, a pivotal axial direction of the crimping assembly and the driving member, and a connection axial direction of the cable stripping assembly and the crimping assembly are parallel to each other.

Abstract: A composition includes: 30 mol % to 60 mol % SiO2; 15 mol % to 35 mol % Al2O3; 5 mol % to 25 mol % Y2O3; 0 mol % to 20 mol % TiO2; and 0 mol % to 25 mol % R2O, such that R2O is the sum of Na2O, K2O, Li2O, Rb2O, and Cs2O.

Abstract: A glass composition includes: from 55.0 mol % to 70.0 mol % SiO2; from 12.0 mol % to 20.0 mol % Al2O3; from 5.0 mol % to 15.0 mol % Li2O; and from 4.0 mol % to 15.0 mol % Na2O. The glass composition has the following relationships ?8.00 mol %?R2O+RO?Al2O3?B2O3?P2O5??1.75 mol %, 9.00?(SiO2+Al2O3+Li2O)/Na2O, and (Li2O+Al2O3+P2O5)/(Na2O+B2O3)?3.50. The glass composition may be used in a glass article or a consumer electronic product.

Abstract: A process tube device can detect the presence of any external materials that may reside within a fluid flowing in the tube. The process tube device detects the external materials in-situ which obviates the need for a separate inspection device to inspect the surface of a wafer after applying fluid on the surface of the wafer. The process tube device utilizes at least two methods of detecting the presence of external materials. The first is the direct measurement method in which a light detecting sensor is used. The second is the indirect measurement method in which a sensor utilizing the principles of Doppler shift is used. Here, contrary to the first method that at least partially used reflected or refracted light, the second method uses a Doppler shift sensor to detect the presence of the external material by measuring the velocity of the fluid flowing in the tube.

Abstract: In a method of inspection of a semiconductor substrate a first beam of light is split into two or more second beams of light. The two or more second beams of light are respectively transmitted onto a first set of two or more first locations on top of the semiconductor substrate. In response to the transmitted two or more second beams of light, two or more reflected beams of light from the first set of two or more first locations are received. The received two or more reflected beams of light are detected to generate two or more detected signals. The two or more detected signals are analyzed to determine whether a defect exists at the set of the two or more first locations.

Abstract: A composite material is provided. The composite material includes (a1) first polyamide polymerized from C10-12 diamine and terephthalic acid or an ester thereof, or (a2) second polyamide polymerized from C8-12 diamine, terephthalic acid or an ester thereof, and 4-aminoalkyl benzoic acid or an ester thereof; and (b) sheet-shaped material having an aspect ratio of 40 to 80. The composite material can be used in the lens base and the barrel of a lens module.