Abstract: A QFN package comprising a die pad, which has a first upper surface and a corresponding first lower surface, and at least a loop shaped groove conformal to, and inside the periphery of, the first lower surface of the die pad. A plurality of leads are formed and located along the boundary edges of the die pad. Each lead has a second upper surface and a corresponding second lower surface. A chip has an active surface and a corresponding back surface, and its back surface is adhered on the first upper surface of the die pad. A plurality of bonding pads is formed on the active surface of the chip, and are electrically connected to the leads. A molding compound, which encapsulates the chip, the die pad and the leads, leaves exposed on the first lower surface of the die pad and the second lower surfaces of the leads.

Abstract: A disturbing plate structure having at least one down set, applicable in a lead frame-type package in a semiconductor. The disturbing plate has at least a lead frame, a die, a glue layer, a plurality of disturbing plates, a top mold compound, and a bottom mold compound. The lead frame has a plurality of leads. Two disturbing plates are located on two sides of the die. A space is formed by bending a first bent portion and a second bent portion of the disturbing plate down. Finally, the lead frame is encapsulated with a mold compound. By adjusting the size of the space formed by the first bent portion and the second bent portion, the top mold compound section has substantially the same volume as the bottom mold compound section to finish the packaging and forming.

Abstract: A thin-type semiconductor device and a die pad thereof are proposed. The thin-type semiconductor device includes a semiconductor chip, a die pad, a plurality of leads and an encapsulant. With the use of a strengthening structure formed on a side surface of the die pad and/or on a first surface of the die pad other than an area for attaching the chip thereto, adherence between the die pad and the encapsulant can be enhanced, as well as delamination between the die pad and the encapsulant or crack in the encapsulant can be prevented from occurrence, and accordingly credibility and reliability of the semiconductor device can be assured.