Abstract: A power supply circuit is configured to supply power to a display panel. The power supply circuit includes a receiver circuit and a transmitter circuit. The receiver circuit is configured to couple the display panel and output a hot plugging signal. The transmitter circuit is configured to receive the hot plugging signal and couple a power circuit. The transmitter circuit is further configured to communicate the receiver circuit to generate an enable signal. The hot plugging signal and the enable signal are configured to control whether a first voltage signal from the power circuit is transmitted to the receiver circuit and the display panel via the transmitter circuit.

Abstract: A power supply circuit is configured to supply power to a display panel. The power supply circuit includes a receiver circuit and a transmitter circuit. The receiver circuit is configured to couple the display panel and output a hot plugging signal. The transmitter circuit is configured to receive the hot plugging signal and couple a power circuit. The transmitter circuit is further configured to communicate the receiver circuit to generate an enable signal. The hot plugging signal and the enable signal are configured to control whether a first voltage signal from the power circuit is transmitted to the receiver circuit and the display panel via the transmitter circuit.

Abstract: An image processing chip test method comprising: controlling a power supply circuit to provide a first operating voltage to an image processing chip comprising a storage device; and when reading written first image data from the storage device, the test device receives a first error detection code corresponding to the first image data and determines whether the first error detection code means an error occurs. If an error occurs, record the first operating voltage as an erroneous operating voltage, and if the error does not occur, provide a second operating voltage to the image processing chip. Also, when the written second image data is read from the storage device, the test device receives a second error detection code corresponding to the second image data and determines whether the second error detection code means an error occurs.

Abstract: An image processing chip test method comprising: controlling a power supply circuit to provide a first operating voltage to an image processing chip comprising a storage device; and when reading written first image data from the storage device, the test device receives a first error detection code corresponding to the first image data and determines whether the first error detection code means an error occurs. If an error occurs, record the first operating voltage as an erroneous operating voltage, and if the error does not occur, provide a second operating voltage to the image processing chip. Also, when the written second image data is read from the storage device, the test device receives a second error detection code corresponding to the second image data and determines whether the second error detection code means an error occurs.