Abstract: A method includes forming a first pull-up transistor and a first pass-gate transistor over a substrate at a first level height, the first pull-up and first pass-gate transistors being of a dual port static random access memory (SRAM) cell; forming a first pull-down transistor and a second pass-gate transistor of the dual port SRAM cell over the substrate at a second level height; forming a second pull-down transistor and a third pass-gate transistor of the dual port SRAM cell over the substrate at a third level height; forming a second pull-up transistor and a fourth pass-gate transistor of the dual port SRAM cell over the substrate at a fourth level height.

Abstract: Various embodiments include stacked transistors and methods of forming stacked transistors. In an embodiment, a device includes: a first nanostructure; a second nanostructure above the first nanostructure; a first gate structure extending along a top surface and a bottom surface of the first nanostructure; and a second gate structure extending along a top surface and a bottom surface of the second nanostructure. The first gate structure is disposed at a first side of the first nanostructure and a first side of the second nanostructure. The second gate structure is disposed at a second side of the first nanostructure and a second side of the second nanostructure. The second side of the first nanostructure is opposite the first side of the first nanostructure. The second side of the second nanostructure opposite the first side of the second nanostructure.

Abstract: A device includes a semiconductor substrate, a first transistor, a second transistor over the first transistor and a first isolation structure. The first transistor is on the semiconductor substrate. The first transistor comprises a first channel, a first source and a first drain. The first source and the first drain are on opposite sides of the first channel. The second transistor comprises a second channel, a second source and a second drain. The second source and the second drain are on opposite sides of the second channel. The first transistor is connected in series with the second transistor. The first isolation structure is vertically between the first drain and the second source.

Abstract: An integrated circuit includes a first transistor and a second transistor. The first transistor includes first semiconductor channel layers, first gate structure, and a first source structure and a first drain structure on opposites sides of the first gate structure. The second transistor includes second semiconductor channel layers, second gate structure, and a second source structure and a second drain structure on opposites sides of the second gate structure. The first source structure of the first transistor is electrically coupled to the second drain structure of the second transistor. A thickness of each of the first semiconductor channel layers is less than a thickness of each of the second semiconductor channel layers, and a bandgap of a material of the first semiconductor channel layers is larger than a bandgap of a material of the second semiconductor channel layers.

Abstract: An integrated circuit includes a first transistor and a second transistor. The first transistor includes first semiconductor channel layers, first gate structure, and a first source structure and a first drain structure on opposites sides of the first gate structure. The second transistor includes second semiconductor channel layers, second gate structure, and a second source structure and a second drain structure on opposites sides of the second gate structure. The first source structure of the first transistor is electrically coupled to the second drain structure of the second transistor. A thickness of each of the first semiconductor channel layers is less than a thickness of each of the second semiconductor channel layers, and a bandgap of a material of the first semiconductor channel layers is larger than a bandgap of a material of the second semiconductor channel layers.