Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: A magnetoresistive random access memory (MRAM) structure, including a substrate and multiple MRAM cells on the substrate, wherein the MRAM cells are arranged in a memory region adjacent to a logic region. An ultra low-k (ULK) layer covers the MRAM cells, wherein the surface portion of ultra low-k layer is doped with fluorine, and dents are formed on the surface of ultra low-k layer at the boundaries between the memory region and the logic region.

Abstract: Disclosed is a fan-out back-to-back chip stacked package, comprising a back-to-back stack of a first chip and a second chip, an encapsulant, a plurality of vias disposed in the encapsulant, a first redistribution layer and a second redistribution layer. The encapsulant encapsulates the sides of the first chip and the sides of the second chip simultaneously and has a thickness not greater than the chip stacked height to expose a first active surface of the first chip and a second active surface of the second chip. The encapsulant has a first peripheral surface expanding from the first active surface and a second peripheral surface expanding from the second active surface. The first redistribution layer is formed on the first active surface and extended onto the first peripheral surface to electrically connect the first chip to the vias in the encapsulant.

Abstract: A substrate of a micro-BGA package is revealed, primarily comprising a substrate core, a first trace, and a second trace where the substrate core has a slot formed between a first board part and a second board part. The first trace is disposed on the first board part and has a suspended inner lead extended into the slot where the inner lead has an assumed broken point. The second trace is disposed on the second board part and is integrally connected to the inner lead at the assumed broken point. More particularly, a non-circular through hole is formed at the assumed broken point and has two symmetric V-notches away from each other and facing toward two opposing external sides of the inner lead so that the inner lead at two opposing external sides does not have the conventional V-notches cutting into the inner lead from outside. Moreover, the inner lead will not unexpectedly be broken and the inner lead can easily and accurately be broken at the assumed broken point during thermal compression processes.

Abstract: A substrate of a micro-BGA package is revealed, primarily comprising a substrate core, a first trace, and a second trace where the substrate core has a slot formed between a first board part and a second board part. The first trace is disposed on the first board part and has a suspended inner lead extended into the slot where the inner lead has an assumed broken point. The second trace is disposed on the second board part and is integrally connected to the inner lead at the assumed broken point. More particularly, a non-circular through hole is formed at the assumed broken point and has two symmetric V-notches away from each other and facing toward two opposing external sides of the inner lead so that the inner lead at two opposing external sides does not have the conventional V-notches cutting into the inner lead from outside. Moreover, the inner lead will not unexpectedly be broken and the inner lead can easily and accurately be broken at the assumed broken point during thermal compression processes.

Abstract: A semiconductor package with a substrate ID code and its manufacturing method are revealed. A circuit and a solder mask are formed on the bottom surface of a substrate where the solder mask covers most of the circuit and a circuit-free zone of the substrate. A chip is disposed on the top surface of the substrate. A substrate ID code consisting of a plurality of laser marks is inscribed in the solder mask or in a portion of an encapsulant on the bottom surface away from the circuit to show the substrate lot number on the bottom surface. Therefore, quality control and failure tracking and management can easily be implemented by tracking the substrate ID code from the semiconductor package without changing the appearance of the semiconductor package. Furthermore, the substrate ID code can be implemented by the existing laser imprinting machines for semiconductor packaging processes and be formed at the same time of formation of a product code.

Abstract: A window ball grid array substrate and its package structure includes a package substrate with a long slot arranged thereon, wherein the improvement is characterized by the long slot penetrating an end of the package substrate making the package substrate appear to be U-shaped.

Abstract: A semiconductor package with a substrate ID code and its manufacturing method are revealed. A circuit and a solder mask are formed on the bottom surface of a substrate where the solder mask covers most of the circuit and a circuit-free zone of the substrate. A chip is disposed on the top surface of the substrate. A substrate ID code consisting of a plurality of laser marks is inscribed in the solder mask or in a portion of an encapsulant on the bottom surface away from the circuit to show the substrate lot number on the bottom surface. Therefore, quality control and failure tracking and management can easily be implemented by tracking the substrate ID code from the semiconductor package without changing the appearance of the semiconductor package. Furthermore, the substrate ID code can be implemented by the existing laser imprinting machines for semiconductor packaging processes and be formed at the same time of formation of a product code.

Abstract: A thermal-enhanced multi-hole semiconductor package is revealed, primarily comprising a substrate with a plurality of alignment holes, a chip disposed on the substrate, an internal heat sink attached to the chip, and an encapsulant. The internal hear sink has a plurality of alignment bars and a heat dissipation surface. The alignment bars are inserted into the alignment holes, but not fully occupying the alignment holes to provide a plurality of flowing channels therein. The encapsulant completely encapsulates the alignment bars through filling the flowing channels. Therefore, the internal heat sink can be aligned to the substrate and is integrally connected with the chip and the substrate utilizing a small amount of adhesive or without any adhesive to form a composite having high rigidity and strong adhesion.

Abstract: A semiconductor package structure with a heat sink is disclosed herein. The semiconductor package structure includes a substrate having a chip mounting area and a plurality of through holes surrounding the chip mounting area; a chip set on the chip mounting area and electrically connected to the substrate; a heat sink covering the chip, wherein the heat sink has a plurality of support portions extending from the upper surface to the lower surface of the substrate via those through holes; and a molding compound covering the chip, a portion of the substrate and the heat sink. Those support portions of the heat sink are utilized to improve the heat dissipation efficiency and the warpage issue of the package.

Abstract: A substrate panel is revealed, comprising a plurality of substrate strips where each substrate strip has a plurality of substrate units and a plurality of appropriative ID marks. Each ID mark is corresponding to and formed on each substrate unit. All of the ID marks are different in a manner to simultaneously recognize both the relative locations of the substrate units to the substrate strips and the relative locations of the substrate strips to the substrate panel. In a preferred embodiment, the ID marks are disposed on exposed surfaces of the substrate units so that it is still visible after semiconductor packaging. Therefore, during or after semiconductor packaging processes, any defect found can be traced back by the ID marks on the substrate units to recognize the locations of the substrate units in the substrate panel for failure analysis to improve PCB manufacturing processes or semiconductor packaging processes for better production yields.