Patents by Inventor Ching Y. Hu

Ching Y. Hu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Estimating the rate of storage corruption from atomic particles
    Patent number: 8375338
    Abstract: Methods and systems estimate a rate of corruption of storage bits in a logic circuit. One or more processors execute instructions that cause the processors to perform the operations that follow. A description is input describing an environment of the logic circuit, and the description of the environment includes a position of the logic circuit. An atomic particle flux density at the logic circuit is estimated as a function of the description of the environment. A specification is input that specifies the storage bits in the logic circuit. The rate of corruption of the storage bits is determined as a function of the atomic particle flux density and a quantification of the storage bits in the logic circuit.
    Type: Grant
    Filed: December 21, 2010
    Date of Patent: February 12, 2013
    Assignee: Xilinx, Inc.
    Inventors: Jameel Hussein, Austin H. Lesea, Kenneth D. Chapman, Ching Y. Hu