Abstract: The disclosure provides a method for fabricating a semiconductor structure with strengthened patterns. The method includes forming a masking layer on the substrate, the masking layer including a peripheral region and an array region adjacent to the peripheral region; forming a first etched peripheral pattern in the peripheral region and a first etched array pattern in the array region, wherein the first etched peripheral pattern and the first etched array pattern have a top surface, a sidewall and a bottom surface, the sidewall connecting the top surface to the bottom surface; forming a second peripheral pattern on the first etched peripheral pattern and forming a second array pattern on the first etched array pattern; and etching the masking layer using the first etched peripheral pattern and the second peripheral pattern as an etching mask to form an etched masking layer in the peripheral region.

Abstract: The disclosure provides a double patterning technology to define peripheral patterns in a DRAM cell. Due to the consideration of line width, the peripheral pattern lines need to undergo two lithographic processes and two etch processes. The presence of additional photoresist patterns in the array region while fabricating peripheral patterns on the M0 layer can increase the stability of peripheral pattern lines. Peripheral pattern lines will not collapse after being subjected to the rinse of developing agent. Moreover, the photoresist coverage of patterns in the array region is not excessive, so the loading effect during etch processes is reduced and the occurrence of photoresist residues is avoided.

Abstract: The disclosure provides a method for fabricating a semiconductor structure with strengthened patterns. The method includes forming a masking layer on the substrate, the masking layer including a peripheral region and an array region adjacent to the peripheral region; forming a first etched peripheral pattern in the peripheral region and a first etched array pattern in the array region, wherein the first etched peripheral pattern and the first etched array pattern have a top surface, a sidewall and a bottom surface, the sidewall connecting the top surface to the bottom surface; forming a second peripheral pattern on the first etched peripheral pattern and forming a second array pattern on the first etched array pattern; and etching the masking layer using the first etched peripheral pattern and the second peripheral pattern as an etching mask to form an etched masking layer in the peripheral region.

Abstract: The disclosure provides a double patterning technology to define peripheral patterns in a DRAM cell. Due to the consideration of line width, the peripheral pattern lines need to undergo two lithographic processes and two etch processes. The presence of additional photoresist patterns in the array region while fabricating peripheral patterns on the M0 layer can increase the stability of peripheral pattern lines. Peripheral pattern lines will not collapse after being subjected to the rinse of developing agent. Moreover, the photoresist coverage of patterns in the array region is not excessive, so the loading effect during etch processes is reduced and the occurrence of photoresist residues is avoided.

Abstract: The present disclosure provides a semiconductor structure and a method for forming the semiconductor structure. The semiconductor structure includes: a polysilicon layer, having a first surface and a second surface opposite to the first surface; a substrate, disposed on the second surface of the polysilicon layer; a bit line structure, disposed on the substrate, penetrating through the polysilicon layer and protruding from the first surface of the polysilicon layer; and a spacer structure, disposed on lateral sidewalls of the bit line structure, including an air gap sandwiched by a first dielectric layer and a second dielectric layer, wherein a first portion of the second dielectric layer is in the polysilicon layer, a second portion of the second dielectric layer is outside the polysilicon layer, and a thickness of the second portion of the second dielectric layer is less than a thickness of the first portion of the second dielectric layer.

Abstract: The present disclosure provides a semiconductor structure and a method for forming the semiconductor structure. The semiconductor structure includes: a polysilicon layer, having a first surface and a second surface opposite to the first surface; a substrate, disposed on the second surface of the polysilicon layer; a bit line structure, disposed on the substrate, penetrating through the polysilicon layer and protruding from the first surface of the polysilicon layer; and a spacer structure, disposed on lateral sidewalls of the bit line structure, including an air gap sandwiched by a first dielectric layer and a second dielectric layer, wherein a first portion of the second dielectric layer is in the polysilicon layer, a second portion of the second dielectric layer is outside the polysilicon layer, and a thickness of the second portion of the second dielectric layer is less than a thickness of the first portion of the second dielectric layer.