Patents by Inventor Ching-Cheng Shih

Ching-Cheng Shih has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect analysis sampling control
    Patent number: 6968251
    Abstract: A defect analysis sampling control system comprising a base setting module, a lot setting module, and a work in process (WIP) prediction module. The base setting module is used for choosing and setting a corresponding sampling rule in accordance with different semiconductor products and the lot setting module is used for choosing and setting a corresponding lot sampling rule in accordance with a product lot. The work in process (WIP) prediction module records all WIP products to provide status and progress of the WIP product. The present invention can be applied to a variety of products so as to control and adjust the sampling rule for all products more conveniently and arrange the sampling rules more flexibly.
    Type: Grant
    Filed: August 16, 2004
    Date of Patent: November 22, 2005
    Assignee: Grace Semiconductor Manufacturing Corporation
    Inventors: Chin-Hsiang Lin, Ching-Cheng Shih
  • Defect analysis sampling control
    Publication number: 20050049737
    Abstract: A defect analysis sampling control system comprising a base setting module, a lot setting module, and a work in process (WIP) prediction module. The base setting module is used for choosing and setting a corresponding sampling rule in accordance with different semiconductor products and the lot setting module is used for choosing and setting a corresponding lot sampling rule in accordance with a product lot. The work in process (WIP) prediction module records all WIP products to provide status and progress of the WIP product. The present invention can be applied to a variety of products so as to control and adjust the sampling rule for all products more conveniently and arrange the sampling rules more flexibly.
    Type: Application
    Filed: August 16, 2004
    Publication date: March 3, 2005
    Inventors: Chin-Hsiang Lin, Ching-Cheng Shih