Patents by Inventor Chingyun Hsiang

Chingyun Hsiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Pattern weakness and strength detection and tracking during a semiconductor device fabrication process
    Patent number: 10062160
    Abstract: Tracking patterns during a semiconductor fabrication process includes: obtaining an image of a portion of a fabricated device; extracting contours of the portion of the fabricated device from the obtained image; aligning the extracted contour to a matching section of a reference design; decomposing the matching section of the reference design into one or more patterns; and updating a pattern tracking database with information pertaining to at least one pattern in the one or more patterns generated as a result of the decomposition.
    Type: Grant
    Filed: September 20, 2017
    Date of Patent: August 28, 2018
    Assignee: Anchor Semiconductor Inc.
    Inventors: Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang, Justin Chen, Raymond Xu, Abhishek Vikram, Ping Zhang
  • PATTERN WEAKNESS AND STRENGTH DETECTION AND TRACKING DURING A SEMICONDUCTOR DEVICE FABRICATION PROCESS
    Publication number: 20180033132
    Abstract: Tracking patterns during a semiconductor fabrication process includes: obtaining an image of a portion of a fabricated device; extracting contours of the portion of the fabricated device from the obtained image; aligning the extracted contour to a matching section of a reference design; decomposing the matching section of the reference design into one or more patterns; and updating a pattern tracking database with information pertaining to at least one pattern in the one or more patterns generated as a result of the decomposition.
    Type: Application
    Filed: September 20, 2017
    Publication date: February 1, 2018
    Inventors: Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang, Justin Chen, Raymond Xu, Abhishek Vikram, Ping Zhang
  • Pattern weakness and strength detection and tracking during a semiconductor device fabrication process
    Patent number: 9846934
    Abstract: Tracking patterns during a semiconductor fabrication process includes: obtaining an image of a portion of a fabricated device; extracting contours of the portion of the fabricated device from the obtained image; aligning the extracted contour to a matching section of a reference design; decomposing the matching section of the reference design into one or more patterns; and updating a pattern tracking database with information pertaining to at least one pattern in the one or more patterns generated as a result of the decomposition.
    Type: Grant
    Filed: March 10, 2016
    Date of Patent: December 19, 2017
    Assignee: Anchor Semiconductor Inc.
    Inventors: Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang, Justin Chen, Raymond Xu, Abhishek Vikram, Ping Zhang
  • PATTERN WEAKNESS AND STRENGTH DETECTION AND TRACKING DURING A SEMICONDUCTOR DEVICE FABRICATION PROCESS
    Publication number: 20160300338
    Abstract: Tracking patterns during a semiconductor fabrication process includes: obtaining an image of a portion of a fabricated device; extracting contours of the portion of the fabricated device from the obtained image; aligning the extracted contour to a matching section of a reference design; decomposing the matching section of the reference design into one or more patterns; and updating a pattern tracking database with information pertaining to at least one pattern in the one or more patterns generated as a result of the decomposition.
    Type: Application
    Filed: March 10, 2016
    Publication date: October 13, 2016
    Inventors: Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang, Justin Chen, Raymond Xu, Abhishek Vikram, Ping Zhang