Patents by Inventor Chith K. Puram

Chith K. Puram has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6269479
    Abstract: A measure of the performance of an object-oriented application program is obtained by measuring, for a plurality of the user input functions of the application program for which a response is provided by the application program, an elapsed time between the initiation of the user input function and the response provided thereto by the application program. The measured elapsed times for each user input function are summed, and then an average response time is obtained for the application program by dividing that sum by the number of user input functions sampled. The measure of performance of the application program may be normalized with respect to a Function Point index derived for the application program. Additionally, for application programs that operate upon a database, the measure of performance may be further normalized with respect to the size of the database.
    Type: Grant
    Filed: November 30, 1998
    Date of Patent: July 31, 2001
    Assignee: Unisys Corporation
    Inventor: Chith K. Puram
  • Patent number: 5347128
    Abstract: Apparatus and process for measuring the variation of directional emittance of surfaces at various temperatures using a radiometric infrared imaging system. A surface test sample is coated onto a copper target plate provided with selective heating within the desired incremental temperature range to be tested and positioned onto a precision rotator to present selected inclination angles of the sample relative to the fixed positioned and optically aligned infrared imager. A thermal insulator holder maintains the target plate on the precision rotator. A screen display of the temperature obtained by the infrared imager, and inclination readings are provided with computer calculations of directional emittance being performed automatically according to equations provided to convert selected incremental target temperatures and inclination angles to relative target directional emittance values.
    Type: Grant
    Filed: April 19, 1993
    Date of Patent: September 13, 1994
    Assignee: Vigyan, Inc.
    Inventors: Chith K. Puram, Kamran Daryabeigi, Robert Wright, David W. Alderfer