Abstract: A method and a processor load/store unit (LSU) are described for performing store-to-load forwarding (STLF) from an interlocking store. STLF is performed when a starting address of the store and the load do not match, or when a data size of the store is smaller than a data size of the load. The LSU detects a load that interlocks with a store, and determines whether all or only a portion of data bytes needed by the load can be provided by the interlocking store. If it is determined that only a portion of the data bytes needed by the load can be provided by the interlocking store, then that portion of the data bytes is provided by a store data buffer (SDB) and the remaining portion of the data bytes needed by the load is provided by a data cache (DC). Otherwise, the SDB provides all of the data bytes.

Abstract: A method and a processor load/store unit (LSU) are described for performing store-to-load forwarding (STLF) from an interlocking store. STLF is performed when a starting address of the store and the load do not match, or when a data size of the store is smaller than a data size of the load. The LSU detects a load that interlocks with a store, and determines whether all or only a portion of data bytes needed by the load can be provided by the interlocking store. If it is determined that only a portion of the data bytes needed by the load can be provided by the interlocking store, then that portion of the data bytes is provided by a store data buffer (SDB) and the remaining portion of the data bytes needed by the load is provided by a data cache (DC). Otherwise, the SDB provides all of the data bytes.

Abstract: A system for on-chip testing of embedded memories using Address Space Identifier (ASI) bus in Scalable Processor ARChitecture (SPARC) microprocessors. An integrated circuit includes a plurality of memory arrays, Address Space Identifier (ASI) bus interface logic connected by an ASI bus to the plurality of memory arrays, and a memory control unit and a memory built-in self-test (MBIST) engine connected to the ASI bus interface logic. Rather than direct access, the MBIST engine utilizes the ASI bus interface logic and the ASI bus to perform memory testing. The MBIST engine, programmed with memory array parameters, includes a programmable state machine controller to which is connected a programmable data generator, a programmable address generator, and a programmable comparator. The data generator provides data as appropriate. The address generator provides addresses as appropriate. The comparator provides test results information for the particular test situation.