Patents by Inventor Chiu-Chu Chang

Chiu-Chu Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Combined probe head for a vertical probe card and method for assembling and aligning the combined probe head thereof
    Patent number: 8933719
    Abstract: A combined probe head being disposed in a space transformer of a vertical probe card is provided, in which the combined probe head is used for differentiating or segmenting a layout area of the probes in the vertical probe card. The combined probe head may include a locating plate and sub-probe heads. The locating plate may include fixed portions. Each sub-probe head may include corresponding sub-dies and probes inserted between the sub-dies, and each sub-probe head is assembled and fixed in the corresponding fixed portion. Therefore, the layout area of the probes in the vertical probe card can be respectively differentiated or segmented from the sub-probe heads in order to avoid mutual interference under repair process. In addition, a related method for assembling and aligning the above mentioned combined probe head is provided.
    Type: Grant
    Filed: July 25, 2011
    Date of Patent: January 13, 2015
    Assignee: MPI Corporation
    Inventors: Chao-Ching Huang, Wen-Chi Chen, Chiu-Chu Chang
  • COMBINED PROBE HEAD FOR A VERTICAL PROBE CARD AND METHOD FOR ASSEMBLING AND ALIGNING THE COMBINED PROBE HEAD THEREOF
    Publication number: 20120025859
    Abstract: A combined probe head being disposed in a space transformer of a vertical probe card is provided, in which the combined probe head is used for differentiating or segmenting a layout area of the probes in the vertical probe card. The combined probe head may include a locating plate and sub-probe heads. The locating plate may include fixed portions. Each sub-probe head may include corresponding sub-dies and probes inserted between the sub-dies, and each sub-probe head is assembled and fixed in the corresponding fixed portion. Therefore, the layout area of the probes in the vertical probe card can be respectively differentiated or segmented from the sub-probe heads in order to avoid mutual interference under repair process. In addition, a related method for assembling and aligning the above mentioned combined probe head is provided.
    Type: Application
    Filed: July 25, 2011
    Publication date: February 2, 2012
    Inventors: Chao-Ching HUANG, Wen-Chi Chen, Chiu-Chu Chang