Abstract: A system, method, and computer readable medium with instructions for verifying an original layout are disclosed. The original layout includes cells arranged in a cell hierarchy, front-end-of-line (FEOL) layers, and back-end-of-line (BEOL) layers. In one embodiment, a reduced layout is generated by trimming out cells below a top tier of the cell hierarchy and filtering out the FEOL layers. A text-based short check is executed on the reduced layout. Next, an augmented reduced layout is generated. The augmented reduced layout includes pin information for cells in a second tier connected to the top tier. An interconnectivity check is then executed on the augmented reduced layout based on a schematic for the circuit. Afterwards, a result (e.g., location of short or connectivity mismatch) based on at least one of the text-based short check and the interconnectivity check is outputted. A conventional LVS check may then be executed.

Abstract: A method is disclosed including analyzing a layout netlist including a first set of nodes against a schematic netlist including a second set of nodes. Each node of the first and second sets of nodes is assigned a matching type for identifying matching nodes between the first and second sets of nodes. The method includes determining one or more unmatched nodes between the first set of nodes and the second set of nodes based on the matching type. The method includes generating a convergence graph comprising nodes of the first set of nodes that have a corresponding matching node in the second set of nodes based on the matching type, and the one or more unmatched nodes.

Abstract: A system, method, and computer readable medium with instructions for verifying an original layout are disclosed. The original layout includes cells arranged in a cell hierarchy, front-end-of-line (FEOL) layers, and back-end-of-line (BEOL) layers. In one embodiment, a reduced layout is generated by trimming out cells below a top tier of the cell hierarchy and filtering out the FEOL layers. A text-based short check is executed on the reduced layout. Next, an augmented reduced layout is generated. The augmented reduced layout includes pin information for cells in a second tier connected to the top tier. An interconnectivity check is then executed on the augmented reduced layout based on a schematic for the circuit. Afterwards, a result (e.g., location of short or connectivity mismatch) based on at least one of the text-based short check and the interconnectivity check is outputted. A conventional LVS check may then be executed.

Abstract: A layout versus schematic (LVS) tool identifies a detected mismatch between a first graph representing a circuit layout and a second graph representing a circuit schematic. The detected mismatch is a device or net represented by a first node in the first graph and a corresponding second node in the second graph. The LVS tool assigns a first value to the first node and to the second node. The LVS tool iterates through nodes in the first graph and nodes in the second graph to assign values based on the first value, according to a graph coloring algorithm, until reaching a third node of the first graph and a corresponding fourth node of the second graph that are assigned different values. The LVS tool generates an output identifying the third node and the fourth node as a root cause of the detected mismatch.

Abstract: A layout versus schematic (LVS) tool identifies a detected mismatch between a first graph representing a circuit layout and a second graph representing a circuit schematic. The detected mismatch is a device or net represented by a first node in the first graph and a corresponding second node in the second graph. The LVS tool assigns a first value to the first node and to the second node. The LVS tool iterates through nodes in the first graph and nodes in the second graph to assign values based on the first value, according to a graph coloring algorithm, until reaching a third node of the first graph and a corresponding fourth node of the second graph that are assigned different values. The LVS tool generates an output identifying the third node and the fourth node as a root cause of the detected mismatch.

Abstract: A layout versus schematic (LVS) tool identifies a detected mismatch between a first graph representing a circuit layout and a second graph representing a circuit schematic. The detected mismatch is a device or net represented by a first node in the first graph and a corresponding second node in the second graph. The LVS tool assigns a first value to the first node and to the second node. The LVS tool iterates through nodes in the first graph and nodes in the second graph to assign values based on the first value, according to a graph coloring algorithm, until reaching a third node of the first graph and a corresponding fourth node of the second graph that are assigned different values. The LVS tool generates an output identifying the third node and the fourth node as a root cause of the detected mismatch.

Abstract: Disclosed herein are methods and devices used for the physical design validation of integrated circuits. One method used for the physical design validation of integrated circuits includes comparing the original circuit netlist of an integrated circuit and the layout data of the integrated circuit and assigning labels to the input and output terminals of the components in the integrated circuit based on the results of the comparison.

Abstract: Disclosed herein are methods and devices used for the physical design validation of integrated circuits. One method used for the physical design validation of integrated circuits includes comparing the original circuit netlist of an integrated circuit and the layout data of the integrated circuit and assigning labels to the input and output terminals of the components in the integrated circuit based on the results of the comparison.

Abstract: Disclosed herein are methods and devices used for the physical design validation of integrated circuits. One method used for the physical design validation of integrated circuits includes comparing the original circuit netlist of an integrated circuit and the layout data of the integrated circuit and assigning labels to the input and output terminals of the components in the integrated circuit based on the results of the comparison.