Patents by Inventor Chok Y. Hung

Chok Y. Hung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test validation method for a semiconductor memory device
    Patent number: 5309446
    Abstract: A test validation process for a semiconductor device applies signals indicating a test mode to the semiconductor device. The device produces output signals and the output signals are read to determine whether the device is in the indicated test mode. The test mode is conducted by operating the device. The output signals are read upon completion of the test mode to determine if the device is still in the indicated test mode. The test validation method is useful for memory chips and particularly Dynamic Random Access Memory, DRAM, devices that are burn-in stress tested.
    Type: Grant
    Filed: August 6, 1992
    Date of Patent: May 3, 1994
    Assignee: Texas Instruments Incorporated
    Inventors: Danny R. Cline, Wah K. Loh, Adin E. Hyslop, Hugh P. McAdams, Chok Y. Hung