Abstract: A leading-edge structure of a passenger boarding bridge floor includes a protruding assembly, a protruding guide structure and an energy storage assembly. Under action of the protruding guide structure and the energy storage assembly, the protruding assembly may be protruded or contracted relative to the passenger boarding bridge floor body. The protruding assembly may automatically adjust according to the position of the airplane, under the action of limiting and guiding of the protruding guide structure, the protruding assembly may be adaptively protruded or retracted relative to the passenger boarding bridge floor body, so as to improve the safety of the airplane.

Abstract: The present disclosure discloses a leading-edge structure of a passenger boarding bridge floor, a passenger boarding bridge floor structure and a passenger bridge. Wherein the leading-edge structure of the passenger boarding bridge floor includes a protruding assembly, a protruding guide structure and an energy storage assembly. Under action of the protruding guide structure and the energy storage assembly, the protruding assembly may be protruded or contracted relative to the passenger boarding bridge floor body. The protruding assembly may automatically adjust according to the position of the airplane, under the action of limiting and guiding of the protruding guide structure, the protruding assembly may be adaptively protruded or retracted relative to the passenger boarding bridge floor body, so as to improve the safety of the airplane.

Abstract: An integrated circuit and method for establishing scan test architecture in the integrated circuit is provided. The integrated circuit includes a plurality of circuit modules. Each circuit module includes a clock control unit, a first pipeline unit, a serialized compressed scan circuit and a second pipeline unit. The clock control unit generates a scan clock according to a test clock. The first pipeline unit converts a test input signal into first data according to the scan clock. The serialized compressed scan circuit generates second data according to the first data and the test clock. The second pipeline unit converts the second data into a test output signal according to the scan clock. The scan clock of each of the circuit modules is independent from the scan clocks of the other circuit modules, thereby reducing the difficulty and cost of timing analysis and adjustment.

Abstract: An integrated circuit and method for establishing scan test architecture in the integrated circuit is provided. The integrated circuit includes a plurality of circuit modules. Each circuit module includes a clock control unit, a first pipeline unit, a serialized compressed scan circuit and a second pipeline unit. The clock control unit generates a scan clock according to a test clock. The first pipeline unit converts a test input signal into first data according to the scan clock. The serialized compressed scan circuit generates second data according to the first data and the test clock. The second pipeline unit converts the second data into a test output signal according to the scan clock. The scan clock of each of the circuit modules is independent from the scan clocks of the other circuit modules, thereby reducing the difficulty and cost of timing analysis and adjustment.

Abstract: In a vise, such as now commonly used to hold a workpiece for drilling, cutting and finishing, the stationary main body is provided with a replaceable jaw member having a plurality of jaw faces, and the adjustible jaw body is formed as a jaw unit having a plurality of jaw plates. Both of the jaw member and the jaw unit are adapted to rotate so that any of the jaw faces and/or the jaw plates can be selected off-handedly in accordance with the kind and shape of a workpiece to insure an ideal grip of the piece.