Patents by Inventor Chong-Kun Lee

Chong-Kun Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9405337
    Abstract: In managing temperature in a system on chip (SOC), a main temperature signal is generated using a main sensor, where the main temperature signal is a signal having a value corresponding to a main temperature of the SOC. Subsidiary temperature signals are generated using subsidiary sensors, where the subsidiary temperature signals are pulse signals having frequencies corresponding to subsidiary temperatures of subsidiary blocks in the SOC, respectively. An operation of the SOC is controlled based upon the main temperature signal and the subsidiary temperature signals.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: August 2, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Ji Hyung Kim, Sang Wook Park, Chong Kun Lee
  • Patent number: 8625095
    Abstract: There is provided an automatic inspection apparatus and method for detecting stains on a polarizing plate using color difference analysis. The automatic inspection apparatus includes an inspection unit including at least one reference polarizing plate and a target polarizing plate or polarizing element mounted on the at least one reference polarizing plate; a light source unit disposed on one surface of the inspection unit and irradiating the inspection unit with light; an imaging unit disposed on the other surface of the inspection unit, imaging the target polarizing plate or polarizing element, and transferring an image thereof; and an arithmetic operation unit performing color difference analysis for individual inspection regions of the image of the target polarizing plate or polarizing element transferred by the imaging unit and detecting a blurred stain.
    Type: Grant
    Filed: April 26, 2012
    Date of Patent: January 7, 2014
    Assignee: LG Chem, Ltd.
    Inventors: Chong-Kun Lee, Kyun-Il Rah, Tae-Hun Kim, Yoo-Min Lee, Sang-Deok Lee
  • Publication number: 20120274939
    Abstract: There is provided an automatic inspection apparatus and method for detecting stains on a polarizing plate using color difference analysis. The automatic inspection apparatus includes an inspection unit including at least one reference polarizing plate and a target polarizing plate or polarizing element mounted on the at least one reference polarizing plate; a light source unit disposed on one surface of the inspection unit and irradiating the inspection unit with light; an imaging unit disposed on the other surface of the inspection unit, imaging the target polarizing plate or polarizing element, and transferring an image thereof; and an arithmetic operation unit performing color difference analysis for individual inspection regions of the image of the target polarizing plate or polarizing element transferred by the imaging unit and detecting a blurred stain.
    Type: Application
    Filed: April 26, 2012
    Publication date: November 1, 2012
    Inventors: Chong-Kun Lee, Kyun-Il Rah, Tae-Hun Kim, Yoo-Min Lee, Sang-Deok Lee