Patents by Inventor Chongjun June Jiang

Chongjun June Jiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6647484
    Abstract: The present invention provides a register-indirect addressing mode using modulo arithmetic to transpose addresses for digital processing systems. The preferred systems and methods permit direct access of column data, which improves matrix computation significantly. The overhead of transpose mode is minimal because it can be implemented, if desired, by sharing hardware and/or software used in circular buffers. Transpose addressing mode also reduces program size and processor power consumed by reducing the sequence of instruction cycles.
    Type: Grant
    Filed: September 19, 2000
    Date of Patent: November 11, 2003
    Assignee: 3 DSP Corporation
    Inventors: Chongjun June Jiang, Kan Lu, Chung Tao-Chang
  • Patent number: 6459317
    Abstract: A flip-flop (14) is disclosed that includes an input circuit (50), a sense amplifier (52) and an output circuit (56). The input circuit (50) is operable to receive a data input signal and to generate complementary data signals. The sense amplifier (52) is coupled to the input circuit (50). The sense amplifier (52) is operable to receive the data signals from the input circuit (50) and to generate complementary amplified signals based on the data signals. The output circuit (56) is coupled to the sense amplifier (52). The output circuit (56) is operable to receive the amplified signals from the sense amplifier (52) and to generate complementary output signals based on the amplified signals.
    Type: Grant
    Filed: December 8, 2000
    Date of Patent: October 1, 2002
    Assignee: Texas Instruments Incorporated
    Inventors: Kan Lu, Chongjun June Jiang, Uming U. Ko
  • Patent number: 5748640
    Abstract: A processing unit having a CPU core, an integrated RAM and a test unit, which may be implemented in either a test unit, which may be implemented in either hardware or software. A built-in self-test of the RAM is designed to run concurrently with the functional vectors used to test the CPU core. Once the core tests have been activated, a control register may be written to by which will activate the built-in self-test. Thus, the BIST and core testing may overlap to minimize test time.
    Type: Grant
    Filed: September 12, 1996
    Date of Patent: May 5, 1998
    Assignee: Advanced Micro Devices
    Inventors: Chongjun (June) Jiang, David A. Spilo, Timothy J. Baldwin, Robert D. Bryfogle, Bobby I. Pinkerton, Jr.