Abstract: A method includes providing a device with transmitter parameters set to default factory values. The method also includes receiving, in the device, one or more write commands with test data patterns, and executing, in the device, the one or more write commands to store the test data patterns on a non-transitory data storage medium of the device. The method further includes receiving, in the device, one or more read commands for the test data patterns, and reading the test data patterns from the non-transitory data storage medium. The read test data patterns are communicated by a signal that is sent via the device transmitter. A command instructing the device to update the transmitter parameters values is received, in the device, when a device transmitter signal integrity for the signal communication is below a predetermined threshold.

Abstract: A method includes providing a device with transmitter parameters set to default factory values. The method also includes receiving, in the device, one or more write commands with test data patterns, and executing, in the device, the one or more write commands to store the test data patterns on a non-transitory data storage medium of the device. The method further includes receiving, in the device, one or more read commands for the test data patterns, and reading the test data patterns from the non-transitory data storage medium. The read test data patterns are communicated by a signal that is sent via the device transmitter. A command instructing the device to update the transmitter parameters values is received, in the device, when a device transmitter signal integrity for the signal communication is below a predetermined threshold.