Patents by Inventor Choon Poh Looi

Choon Poh Looi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process of testing memory parts and equipment for conducting the testing
    Patent number: 5862146
    Abstract: A process and apparatus for testing wide word memory parts (618-624), sixteen data I/O leads per part, uses two stages of relays (610, 612 and 614) to connect the memory parts to sixteen test receivers (Ra, Rb, Rc and Rd). When the memory parts are in a normal operating mode or non-DFT mode, the relays connect all sixteen data I/O leads of each memory part to the sixteen test receivers, one memory part at a time. When the memory parts are in the DFT mode, the relays connect all the active DFT data I/O leads (0-3) to the receivers. A test performance board can carry one or more modules of memory parts with each module containing plural sockets for retaining the memory parts and one or more stages of relays.
    Type: Grant
    Filed: April 15, 1997
    Date of Patent: January 19, 1999
    Assignee: Texas Instruments Incorporated
    Inventors: Teck Liong Chen, Choon Poh Looi, Fock San Ho, Kok Lay Lim