Patents by Inventor Choong rae Ro

Choong rae Ro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7293226
    Abstract: A method for performing a defect scan according to the characteristics of channels of a data storage system by determining design parameters based on the channel characteristics includes measuring characterization values related to the performance for channels of the data storage system; determining parameters for the respective channels based on the measured characterization values, the parameters for determining the data processing characteristics of the respective channel; and performing a defect scan on the data storage system using the determined parameters in a data processing process for the respective channels.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: November 6, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Choong rae Ro, Chang-sik Kwon
  • Publication number: 20040153949
    Abstract: A method for performing a defect scan according to the characteristics of channels of a data storage system by determining design parameters based on the channel characteristics includes measuring characterization values related to the performance for channels of the data storage system; determining parameters for the respective channels based on the measured characterization values, the parameters for determining the data processing characteristics of the respective channel; and performing a defect scan on the data storage system using the determined parameters in a data processing process for the respective channels.
    Type: Application
    Filed: November 12, 2003
    Publication date: August 5, 2004
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Choong-Rae Ro, Chang-Sik Kwon