Patents by Inventor Chou Hsing

Chou Hsing has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Overlay mark for a non-critical layer of critical dimensions
    Publication number: 20060103034
    Abstract: An overlay mark for monitoring the critical dimension of a non-critical layer, comprising four first bars which are bar-shaped and separated from each other. The four first bars enclose to form a rectangle, and each first bar is correspondingly parallel to each side of the rectangle. The four second bars, wherein each second bar is bar-shaped and separated from each other, and the four second bars are positioned in the rectangle, and each second bar is correspondingly parallel to each side of the rectangle and comprise a plurality of third bars parallel with each other.
    Type: Application
    Filed: November 15, 2004
    Publication date: May 18, 2006
    Inventors: Kuo-Kuei Fu, Chou Hsing