Patents by Inventor Chris BONINO

Chris BONINO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions
    Patent number: 11988593
    Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.
    Type: Grant
    Filed: November 20, 2020
    Date of Patent: May 21, 2024
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Timothy A Ellis, Chris Bonino, Brian A. Knollenberg, James Lumpkin, Daniel Rodier, Dwight Sehler, Mehran Vahdani Moghaddam, Thomas Ramin
  • ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION AND DETECTION OF PARTICLES HAVING SMALL SIZE DIMENSIONS
    Publication number: 20240133793
    Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.
    Type: Application
    Filed: October 26, 2023
    Publication date: April 25, 2024
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
  • ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION AND DETECTION OF PARTICLES HAVING SMALL SIZE DIMENSIONS
    Publication number: 20210208054
    Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.
    Type: Application
    Filed: November 20, 2020
    Publication date: July 8, 2021
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN