Patents by Inventor Chris Deemer

Chris Deemer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection
    Patent number: 6517238
    Abstract: A system and method for determining lateral thermal diffusivity of a material sample using a heat pulse; a sample oriented within an orthogonal coordinate system; an infrared camera; and a computer that has a digital frame grabber, and data acquisition and processing software. The mathematical model used within the data processing software is capable of determining the lateral thermal diffusivity of a sample of finite boundaries. The system and method may also be used as a nondestructive method for detecting and locating cracks within the material sample.
    Type: Grant
    Filed: January 18, 2001
    Date of Patent: February 11, 2003
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Jiangang Sun, Chris Deemer
  • Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection
    Publication number: 20020126730
    Abstract: A system and method for determining lateral thermal diffusivity of a material sample using a heat pulse; a sample oriented within an orthogonal coordinate system; an infrared camera; and a computer that has a digital frame grabber, and data acquisition and processing software. The mathematical model used within the data processing software is capable of determining the lateral thermal diffusivity of a sample of finite boundaries. The system and method may also be used as a nondestructive method for detecting and locating cracks within the material sample.
    Type: Application
    Filed: January 18, 2001
    Publication date: September 12, 2002
    Inventors: Jiangang Sun, Chris Deemer