Patents by Inventor Chris Langworthy

Chris Langworthy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for analyzing electrical failure data
    Patent number: 7319935
    Abstract: A system and method to perform analysis on test results of multiple integrated circuits. Based on the analysis, the system and method display a wafer map having map indicators representing statistical values of the test results.
    Type: Grant
    Filed: February 12, 2003
    Date of Patent: January 15, 2008
    Assignee: Micron Technology, Inc.
    Inventors: Xueqing Sun, Mark Eyolfson, Chris Langworthy, Karl L. Major
  • System and method for analyzing electrical failure data
    Publication number: 20060265156
    Abstract: Some embodiments of the invention include system and method for performing a calculation on the data associated with a group of wafers. The system and method display a wafer map having map indicators representing calculation results from the calculation. Other embodiments are described and claimed.
    Type: Application
    Filed: July 26, 2006
    Publication date: November 23, 2006
    Inventors: Xueqing Sun, Mark Eyolfson, Chris Langworthy, Karl Major
  • System and method for analyzing electrical failure data
    Publication number: 20040158783
    Abstract: A system and method to perform analysis on test results of multiple integrated circuits. Based on the analysis, the system and method display a wafer map having map indicators representing statistical values of the test results.
    Type: Application
    Filed: February 12, 2003
    Publication date: August 12, 2004
    Applicant: Micron Technology, Inc.
    Inventors: Xueqing Sun, Mark Eyolfson, Chris Langworthy, Karl L. Major