Patents by Inventor Chris M. Hodapp

Chris M. Hodapp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230134403
    Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
    Type: Application
    Filed: December 20, 2022
    Publication date: May 4, 2023
    Inventors: Joseph M. Kesler, Thomas D. Sharp, Uriah M. Liggett, Brian Bahr, Chris M. Hodapp, Gary E. Coyan
  • Patent number: 11543811
    Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
    Type: Grant
    Filed: January 5, 2018
    Date of Patent: January 3, 2023
    Assignee: Etegent Technologies Ltd.
    Inventors: Joseph M. Kesler, Thomas D. Sharp, Uriah M. Ligget, Brian Bahr, Chris M. Hodapp, Gary E. Coyan
  • Publication number: 20200218242
    Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
    Type: Application
    Filed: January 5, 2018
    Publication date: July 9, 2020
    Applicant: Etegent Technologies Ltd.
    Inventors: Joseph M. Kesler, Thomas D. Sharp, Uriah M. Ligget, Brian Bahr, Chris M. Hodapp, Gary E. Coyan
  • Publication number: 20190212721
    Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
    Type: Application
    Filed: January 5, 2018
    Publication date: July 11, 2019
    Inventors: Joseph M. Kesler, Thomas D. Sharp, Uriah M. Ligget, Brian Bahr, Chris M. Hodapp, Gary E. Coyan
  • Patent number: 9864366
    Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: January 9, 2018
    Assignee: Etegent Technologies Ltd.
    Inventors: Joseph M. Kesler, Thomas D. Sharp, Uriah M. Liggett, Brian Bahr, Chris M. Hodapp, Gary E. Coyan
  • Publication number: 20140277662
    Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
    Type: Application
    Filed: March 14, 2014
    Publication date: September 18, 2014
    Applicant: Etegent Technologies Ltd.
    Inventors: Joseph M. Kesler, Thomas D. Sharp, Uriah M. Liggett, Brian Bahr, Chris M. Hodapp, Gary E. Coyan