Abstract: A method, system and apparatus for encoding an RFID inlay incorporated in an object, the object having indicia disposed thereon. The system can include an object transporting mechanism, a scanner for scanning the indicia, at least one RFID antenna for encoding the RFID inlay, and a processor in communication with and adapted to control the operation of the object transporting mechanism, the scanner, and the at least one RFID antenna.

Abstract: A system and method is described for an automated RFID quality control process. The method may include configuring an RFID manufacturing press with quality control specifications, manufacturing a batch of RFID inlays, executing a performance test on each RFID inlay, comparing the results of the performance test to the quality control specifications, and determining a pass or fail status for the batch of RFID inlays based on the results of the performance test. The system may include an RFID manufacturing press having at least one lane, at least one interrogator antenna, and programmable control logic for the RFID manufacturing press, wherein the programmable control logic is adapted to execute a performance test on each RFID relay of a batch of RFID relays output by the manufacturing press, compare the results of the performance test to user-configurable quality control specifications, and determine whether the batch of RFID relays meets the specifications.

Abstract: A method, system and apparatus for encoding an RFID inlay incorporated in an object, the object having indicia disposed thereon. The system can include an object transporting mechanism, a scanner for scanning the indicia, at least one RFID antenna for encoding the RFID inlay, and a processor in communication with and adapted to control the operation of the object transporting mechanism, the scanner, and the at least one RFID antenna.

Abstract: A system and method is described for an automated RFID quality control process. The method may include configuring an RFID manufacturing press with quality control specifications, manufacturing a batch of RFID inlays, executing a performance test on each RFID inlay, comparing the results of the performance test to the quality control specifications, and determining a pass or fail status for the batch of RFID inlays based on the results of the performance test. The system may include an RFID manufacturing press having at least one lane, at least one interrogator antenna, and programmable control logic for the RFID manufacturing press, wherein the programmable control logic is adapted to execute a performance test on each RFID relay of a batch of RFID relays output by the manufacturing press, compare the results of the performance test to user-configurable quality control specifications, and determine whether the batch of RFID relays meets the specifications.