Patents by Inventor Chris Pawlowicz

Chris Pawlowicz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit tracing using a focused ion beam
    Patent number: 9383327
    Abstract: Methods and systems for tracing circuitry on integrated circuits using focused ion beam based imaging techniques. A first component or node on an integrated circuit is coupled to a second component or node on the same integrated circuit. After an external bias is applied to the first component or node, a focused ion beam is applied to the integrated circuit and an image is taken using an electron detector. The features or components on the integrated circuit which are coupled to the second component or node will show up in high contrast on the resulting image. The method may also involve applying a bias to a node or component and then using focused ion beam imaging techniques (through an electron detector) to arrive at an image of the integrated circuit. Components coupled to the node will appear in high contrast in the resulting image.
    Type: Grant
    Filed: June 19, 2014
    Date of Patent: July 5, 2016
    Assignee: TECHINSIGHTS INC.
    Inventors: Chris Pawlowicz, Alexander Sorkin, Michael W. Phaneuf, Alexander Krechmer, Ken G. Lagarec
  • CIRCUIT TRACING USING A FOCUSED ION BEAM
    Publication number: 20140319343
    Abstract: Methods and systems for tracing circuitry on integrated circuits using focused ion beam based imaging techniques. A first component or node on an integrated circuit is coupled to a second component or node on the same integrated circuit. After an external bias is applied to the first component or node, a focused ion beam is applied to the integrated circuit and an image is taken using an electron detector. The features or components on the integrated circuit which are coupled to the second component or node will show up in high contrast on the resulting image. The method may also involve applying a bias to a node or component and then using focused ion beam imaging techniques (through an electron detector) to arrive at an image of the integrated circuit. Components coupled to the node will appear in high contrast in the resulting image.
    Type: Application
    Filed: June 19, 2014
    Publication date: October 30, 2014
    Inventors: Chris Pawlowicz, Alexander Sorkin, Michael W. Phaneuf, Alexander Krechmer, Ken G. Lagarec
  • Circuit tracing using a focused ion beam
    Patent number: 8791436
    Abstract: Methods and systems for tracing circuitry on integrated circuits using focused ion beam based imaging techniques. A first component or node on an integrated circuit is coupled to a second component or node on the same integrated circuit. After an external bias is applied to the first component or node, a focused ion beam is applied to the integrated circuit and an image is taken using an electron detector. The features or components on the integrated circuit which are coupled to the second component or node will show up in high contrast on the resulting image. The method may also involve applying a bias to a node or component and then using focused ion beam imaging techniques (through an electron detector) to arrive at an image of the integrated circuit. Components coupled to the node will appear in high contrast in the resulting image.
    Type: Grant
    Filed: April 24, 2013
    Date of Patent: July 29, 2014
    Inventors: Chris Pawlowicz, Alexander Sorkin, Michael W. Phaneuf, Alexander Krechmer, Ken G. Lagarec