Patents by Inventor Chris R. Stone

Chris R. Stone has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Minimally invasive implantable neurostimulation system
    Patent number: 11957893
    Abstract: A neuromodulation therapy is delivered via at least one electrode implanted subcutaneously and superficially to a fascia layer superficial to a nerve of a patient. In one example, an implantable medical device is deployed along a superficial surface of a deep fascia tissue layer superficial to a nerve of a patient. Electrical stimulation energy is delivered to the nerve through the deep fascia tissue layer via implantable medical device electrodes.
    Type: Grant
    Filed: August 25, 2020
    Date of Patent: April 16, 2024
    Assignee: Medtronic, Inc.
    Inventors: Brad C. Tischendorf, John E. Kast, Thomas P. Miltich, Gordon O. Munns, Randy S. Roles, Craig L. Schmidt, Joseph J. Viavattine, Christian S. Nielsen, Prabhakar A. Tamirisa, Anthony M. Chasensky, Markus W. Reiterer, Chris J. Paidosh, Reginald D. Robinson, Bernard Q. Li, Erik R. Scott, Phillip C. Falkner, Xuan K. Wei, Eric H. Bonde, David A. Dinsmoor, Duane L. Bourget, Forrest C M Pape, Gabriela C. Molnar, Joel A. Anderson, Michael J. Ebert, Richard T. Stone, Shawn C. Kelley, Stephen J. Roddy, Timothy J. Denison, Todd V. Smith
  • Minimally invasive implantable neurostimulation system
    Patent number: 11957894
    Abstract: A neuromodulation therapy is delivered via at least one electrode implanted subcutaneously and superficially to a fascia layer superficial to a nerve of a patient. In one example, an implantable medical device is deployed along a superficial surface of a deep fascia tissue layer superficial to a nerve of a patient. Electrical stimulation energy is delivered to the nerve through the deep fascia tissue layer via implantable medical device electrodes.
    Type: Grant
    Filed: August 25, 2020
    Date of Patent: April 16, 2024
    Assignee: Medtronic, Inc.
    Inventors: Anthony M. Chasensky, Bernard Q. Li, Brad C. Tischendorf, Chris J. Paidosh, Christian S. Nielsen, Craig L. Schmidt, David A. Dinsmoor, Duane L. Bourget, Eric H. Bonde, Erik R. Scott, Forrest C M Pape, Gabriela C. Molnar, Gordon O. Munns, Joel A. Anderson, John E. Kast, Joseph J. Viavattine, Markus W. Reiterer, Michael J. Ebert, Phillip C. Falkner, Prabhakar A. Tamirisa, Randy S. Roles, Reginald D. Robinson, Richard T. Stone, Shawn C. Kelley, Stephen J. Roddy, Thomas P. Miltich, Timothy J. Denison, Todd V. Smith, Xuan K. Wei
  • Yield-enhancing device failure analysis
    Patent number: 8738977
    Abstract: In a system including a processor and memory coupled to the processor, a method of device failure analysis includes the steps of: upon each error detected within a test series performed on a device, the processor storing within a table in the memory an address at which the error occurred in the device and storing a bit position of each failed bit corresponding to that address; for each unique address at which at least one error occurred, determining how many different bit positions corresponding to the address failed during the test series; and based on results of the test series, determining whether the device failed the test series.
    Type: Grant
    Filed: August 31, 2006
    Date of Patent: May 27, 2014
    Assignee: Agere Systems LLC
    Inventors: David A. Brown, James Thomas Kirk, David P. Sonnier, Chris R. Stone
  • Yield-Enhancing Device Failure Analysis
    Publication number: 20080072118
    Abstract: In a system including a processor and memory coupled to the processor, a method of device failure analysis includes the steps of: upon each error detected within a test series performed on a device, the processor storing within a table in the memory an address at which the error occurred in the device and storing a bit position of each failed bit corresponding to that address; for each unique address at which at least one error occurred, determining how many different bit positions corresponding to the address failed during the test series; and based on results of the test series, determining whether the device failed the test series.
    Type: Application
    Filed: August 31, 2006
    Publication date: March 20, 2008
    Inventors: David A. Brown, James Thomas Kirk, David P. Sonnier, Chris R. Stone