Patents by Inventor Chris Vu

Chris Vu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and test apparatus for testing integrated circuits using both valid and invalid test data
    Publication number: 20060123294
    Abstract: A simplified boundary scan test method capable of performing boundary test scanning of semiconductor chips. The test method comprises providing valid test data to a first terminal of the semiconductor device and purposely providing invalid test data to a second terminal of the semiconductor device in a predetermined pattern algorithm. Preload data is also preloaded onto the semiconductor device. The valid and invalid test data is then captured in the semiconductor device. If the captured data is as expected, it signifies that there is no problem with the boundary scan circuitry on the device. On the other hand if the captured data differs from what is expected, it signifies that there may be a problem with the boundary scan circuitry.
    Type: Application
    Filed: November 17, 2004
    Publication date: June 8, 2006
    Applicant: LSI Logic Corporation A Delaware Corporation
    Inventor: Chris Vu