Patents by Inventor Chris W Lagerberg

Chris W Lagerberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for indexing an adjustable test probe tip
    Patent number: 8922231
    Abstract: Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.
    Type: Grant
    Filed: January 23, 2012
    Date of Patent: December 30, 2014
    Assignee: Fluke Corporation
    Inventors: Chris W. Lagerberg, Roger Stark
  • METHOD AND APPARATUS FOR INDEXING AN ADJUSTABLE TEST PROBE TIP
    Publication number: 20120119771
    Abstract: Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.
    Type: Application
    Filed: January 23, 2012
    Publication date: May 17, 2012
    Applicant: FLUKE CORPORATION
    Inventors: Chris W. Lagerberg, Roger Stark
  • Method and apparatus for indexing an adjustable test probe tip
    Patent number: 8154316
    Abstract: Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.
    Type: Grant
    Filed: December 11, 2008
    Date of Patent: April 10, 2012
    Assignee: Fluke Corporation
    Inventors: Chris W. Lagerberg, Roger Stark
  • Reversible test probe and test probe tip
    Patent number: 7902848
    Abstract: A reversible test probe and test probe tip. In one embodiment, a test probe tip is reversible relative to a test probe body. The reversible probe has a first probe tip at a first end and a second probe tip at a second end. The test probe body has an opening operable to receive the first probe tip and the second probe tip. When the first probe tip is positioned in the opening, the first probe tip is electrically coupled to a metal device in the test probe body. When the second probe tip is positioned in the opening, the second probe tip is electrically coupled to a metal device in the test probe body. In another embodiment, a test probe having two test probe tips is reversible relative to a test lead.
    Type: Grant
    Filed: January 9, 2009
    Date of Patent: March 8, 2011
    Assignee: Fluke Corporation
    Inventors: Larry Eccleston, Chris W. Lagerberg, John Renner, III, David J. Gibson, Sr.
  • REVERSIBLE TEST PROBE AND TEST PROBE TIP
    Publication number: 20100176828
    Abstract: A reversible test probe and test probe tip. In one embodiment, a test probe tip is reversible relative to a test probe body. The reversible probe has a first probe tip at a first end and a second probe tip at a second end. The test probe body has an opening operable to receive the first probe tip and the second probe tip. When the first probe tip is positioned in the opening, the first probe tip is electrically coupled to a metal device in the test probe body. When the second probe tip is positioned in the opening, the second probe tip is electrically coupled to a metal device in the test probe body. In another embodiment, a test probe having two test probe tips is reversible relative to a test lead.
    Type: Application
    Filed: January 9, 2009
    Publication date: July 15, 2010
    Applicant: Fluke Corporation
    Inventors: Larry Eccleston, Chris W. Lagerberg, John Renner, III, David J. Gibson, SR.
  • METHOD AND APPARATUS FOR INDEXING AN ADJUSTABLE TEST PROBE TIP
    Publication number: 20100148759
    Abstract: Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.
    Type: Application
    Filed: December 11, 2008
    Publication date: June 17, 2010
    Applicant: Fluke Corporation
    Inventors: Chris W. Lagerberg, Roger Stark
  • Holster for digital multimeter case
    Patent number: D552846
    Type: Grant
    Filed: October 6, 2006
    Date of Patent: October 16, 2007
    Assignee: Fluke Corporation
    Inventors: Chris W Lagerberg, Edmond C Eng
  • Instrument holster
    Patent number: D480558
    Type: Grant
    Filed: October 30, 2002
    Date of Patent: October 14, 2003
    Assignee: Fluke Corporation
    Inventors: John K. Ikeda, Chris W. Lagerberg
  • Digital multimeter case
    Patent number: D562317
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: February 19, 2008
    Assignee: Fluke Corporation
    Inventors: Chris W Lagerberg, Edmond C Eng