Patents by Inventor Chris Wooten

Chris Wooten has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor wafer review system and method
    Patent number: 6401008
    Abstract: A semiconductor wafer review system and method. A method and system for front and back side review of semiconductor wafers is provided in various embodiments. Inspection data for the front side is used to position the wafer for front side review, and a wafer inverter is provided to flip the wafer for back side review. Inspection data for the back side is used to position the wafer for back side review.
    Type: Grant
    Filed: November 18, 1998
    Date of Patent: June 4, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Edward E. Ehrichs, Chris Wooten
  • Semiconductor wafer analysis system and method
    Patent number: 6156580
    Abstract: A semiconductor wafer analysis system and method. In various embodiments, methods and systems are described for inspection and review of semiconductor wafers. Wafer inverters are provided, and inspection data is gathered for both the front and back sides of the wafers. The wafer inverters are also available at wafer review stations so that both the front and back sides of the wafers can be reviewed with a microscope.
    Type: Grant
    Filed: November 18, 1998
    Date of Patent: December 5, 2000
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Chris Wooten, Edward E. Ehrichs