Abstract: The invention concerns a system for determining the topography of a diffusely reflecting curved surface, that comprises two telecentric projection branches that project fringe images of a Ronchi grating on the diffusely reflecting curved surface, and a viewing branch of which the optical system projects an image of the illuminated surface on its camera target, and comprises further a computer that receives the fringe images recorded by the camera target and calculates from these the topography of the anterior eye surfaces, in which system the projection sources are semiconductor diodes and the optical system of the viewing branch is two-sided telecentric.

Abstract: The invention concerns a system for determining the topography of a diffusely reflecting curved surface, that comprises two telecentric projection branches that project fringe images of a Ronchi grating on the diffusely reflecting curved surface, and a viewing branch of which the optical system projects an image of the illuminated surface on its camera target, and comprises further a computer that receives the fringe images recorded by the camera target and calculates from these the topography of the anterior eye surfaces, in which system the projection sources are semiconductor diodes and the optical system of the viewing branch is two-sided telecentric.

Abstract: The present invention is directed to an optical system for measuring the rotation angle of rotatable object having a rotation shaft (2), which system comprises a reflective diffraction element (6) mounted on said shaft and a module that includes a radiation source (8) emitting a monochromatic beam (bo) towards this element and a radiation-sensitive detection structure (14, 16), the diffraction element is configured to project diffraction order images (18) of its pattern onto associated sections (50(1)-54(2)) of an annular grating structure forming part of the detection structure and the surface size of the diffraction element is smaller than 20% of the surface size of the annular grating structure.

Abstract: The present invention is directed to an optical system for measuring the rotation angle of rotatable object having a rotation shaft (2), which system comprises a reflective diffraction element (6) mounted on said shaft and a module that includes a radiation source (8) emitting a monochromatic beam (bo) towards this element and a radiation-sensitive detection structure (14, 16), the diffraction element is configured to project diffraction order images (18) of its pattern onto associated sections (50(1)-54(2)) of an annular grating structure forming part of the detection structure and the surface size of the diffraction element is smaller than 20% of the surface size of the annular grating structure.

Abstract: The invention relates to a method for microscoping an object with a (phase-measurement) interference microscope with extremely high resolution, in which the light beam of a light source is divided into at least two coherent part beams, of which at least one serves for illuminating the object, and whereby the part beams are interferingly combined again and supplied to an interference figure detector screened into image zones, for achieving a resolution beyond the diffraction limit. Furthermore, the invention relates to an interference microscope, preferably for carrying out the above method.

Abstract: The height of a surface (25) along an axis (4) is determined by measuring the axial position of an irradiated spot (31) formed on the surface at the intersection of the surface and the axis. Radiation reflected by the surface and collected by a lens (8) forms an image spot (32) on the axis (4). The position of the image spot is determined by measuring the intensity of the radiation at at least three positions along the axis by means of a detection unit (35). The output signals (44, 44') of the detection unit are processed in an electronic means (43) for determining the position of the highest radiation intensity and for supplying a signal (43') whose magnitude represents the axial position of the image spot (32), hence, of the irradiated spot (31 ).

Abstract: An optical scanning device for scanning an information plane (2) having tracks is described, which device comprises a radiation source (4) supplying a scanning beam (3) and an objective system (5) for focusing the scanning beam to a scanning spot on the information plane (2). To obtain two tracking spots, two grating parts located at both sides of the scanning beam and capturing border rays from the radiation source are used.

Abstract: An apparatus for optically scanning a surface, such as the information surface of an optical record carrier. An error in focus of the scanning spot on the surface is detected by providing two gratings in succession in the path of the beam reflected from the surface. The grating periods of the two gratings are related in accordance with the nominal beam divergence at zero focus error, and the grating strips thereof are parallel but offset with respect to each other. A bounding line between detectors in a composite radiation-sensitive detection system extends parallel to the grating strips. An interference pattern of light and dark bands is projected by the second grating on the detection system, such pattern having an intensity distribution which varies with variations in focus error and can be enhanced by an appropriate value of the offset between the two gratings.

Abstract: Apparatus for scanning the information surface of an optical disc record carrier with a radiation beam. Errors in beam focus on such surface are detected by providing two optical gratings in succession in the path of the radiation reflected from the record carrier. The gratings have a constant grating period, which may be equal or in a fixed ratio, the directions of the grating strips of the two gratings intersecting each other at a relatively small angle, thereby forming a Moire interference pattern in the radiation emergent from the two gratings which rotates due to changes in beam focus. This changes the relative amounts of radiation received by an assembly of radiation detecting elements adjacent the second grating, producing a focus error control signal which can be employed for correcting beam focus.

Abstract: An optical fiber (5) is coupled to an end face (5) of a semiconductor laser diode and the other end face is coupled to one end of a monomode optical waveguide. The other end of waveguide is terminated in a reflecting manner, e.g. by mirror, to reduce the coherence length of the laser. Thus, so-called "speckle patterns" are only produced in the transmission fiber over a short distance from the laser and modal noise further on in the transmission fiber can be prevented by avoiding the use of non-ideal fiber couplings or other connections having a spatial filter effect within this short distance from the laser.

Abstract: An apparatus is described for reading a record carrier on which information is stored in an optically readable reflecting structure. By projecting two radiation spots one before and one behind the plane of the information structure, it is possible to ascertain whether a read beam is properly focussed on the information structure. An optical wedge-field lens combination extends the range of operation of the focus correction device.