Patents by Inventor Christian Amann
Christian Amann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12197825Abstract: A computer-implemented method for probabilistic quantification of probability of failure of a component, especially a gas turbine component, which during operation is subjected to cyclic stress, wherein the component is divided virtually in one or more domains. The method includes: providing or determining for at least one domain, a domain probability density function for crack initiation and providing or determining for the considered domains a domain probability density function for subsequent crack propagation induced failure. Determining for each considered domain a combined domain cumulative distribution function for failure or its probability density function is done by convoluting either both the considered domain probability density functions for crack initiation induced failure and the respective domain probability density function for subsequent crack propagation induced failure, or their integral function.Type: GrantFiled: October 31, 2019Date of Patent: January 14, 2025Assignee: Siemens Energy Global GmbH & Co. KGInventors: Francesco Radaelli, Christian Amann, Kai Kadau, Sebastian Schmitz, Markus Vöse
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Publication number: 20210383035Abstract: A computer-implemented method for probabilistic quantification of probability of failure of a component, especially a gas turbine component, which during operation is subjected to cyclic stress, wherein the component is divided virtually in one or more domains. The method includes: providing or determining for at least one domain, a domain probability density function for crack initiation and providing or determining for the considered domains a domain probability density function for subsequent crack propagation induced failure. Determining for each considered domain a combined domain cumulative distribution function for failure or its probability density function is done by convoluting either both the considered domain probability density functions for crack initiation induced failure and the respective domain probability density function for subsequent crack propagation induced failure, or their integral function.Type: ApplicationFiled: October 31, 2019Publication date: December 9, 2021Applicant: Siemens Energy Global GmbH & Co. KGInventors: Francesco Radaelli, Christian Amann, Kai Kadau, Sebastian Schmitz, Markus Vöse
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Patent number: 10416347Abstract: The disclosure relates to a locating system, comprising at least one hand-held locating sensor, which is provided for capturing locating data related to objects to be located that are hidden under an examination surface, a position sensor, which is provided for capturing position data, which can be associated with the locating data, and an evaluating unit, which is provided for determining at least two-dimensional map information from the locating data and the position data and providing said at least two-dimensional map information. According to the disclosure, the locating system comprises at least one data source, which is provided for providing data for the purpose of a modification of the at least two-dimensional map information.Type: GrantFiled: April 22, 2015Date of Patent: September 17, 2019Assignee: Robert Bosch GmbHInventors: Reiner Krapf, Heiko Sgarz, Jan-Michael Brosi, Christian Amann, Ralph Dammertz
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Patent number: 10401532Abstract: An imaging locating device includes a first locating apparatus, a position sensor, and an evaluation apparatus. The first locating apparatus is configured to detect locating data in relation to objects to be located. The objects are concealed under an examination surface. The position sensor is configured to detect position data of the locating device in relation to the examination surface. The evaluation apparatus is configured to determine a first at least two-dimensional map information items by assigning the locating data of a first category from the first locating apparatus to the position data. The evaluation data is further configured to determine at least one further at least two-dimensional map information item. The at least one further at least two-dimensional map information item differs from the first at least two-dimensional map information item.Type: GrantFiled: June 25, 2015Date of Patent: September 3, 2019Assignee: Robert Bosch GmbHInventors: Heiko Sgarz, Jan-Michael Brosi, Tobias Zibold, Christian Amann, Sebastian Jackisch
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Patent number: 9957809Abstract: A layer system including a substrate and a layer is provided. The layer system has a hole at least in the layer, and wherein at least one recess is present in a surface of the layer in a vicinity around the hole or directly adjoining a boundary line of the hole.Type: GrantFiled: September 14, 2012Date of Patent: May 1, 2018Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Christian Amann, Thomas Beck, Björn Beckmann, Andreas Böttcher, Winfried Esser, Giuseppe Gaio, Rudolf Küperkoch, Eckart Schumann, Rostislav Teteruk
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Patent number: 9862002Abstract: A process for producing a layer system is provided wherein the layer system has at least a substrate, a ceramic layer, which is applied to a surface structured in a targeted manner, in which process the intermediate layer, in particular the metallic layer, is applied in such a way that the recesses form during the coating. By introducing recesses into a surface, the stresses in the ceramic layer on the metallic substrate are reduced in such a manner that a longer lifespan for the ceramic layer is achieved.Type: GrantFiled: September 14, 2012Date of Patent: January 9, 2018Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Fathi Ahmad, Christian Amann, Björn Beckmann, Björn Buchholz, Giuseppe Gaio, Thomas Hille, Eckart Schumann, Rostislav Teteruk
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Patent number: 9857242Abstract: A method for analyzing a three-dimensional stress concentrating feature of a component (60), such as a borehole (62), using a two-dimensional probabilistic technique. A circumferentially-dependent stress concentration profile around the stress concentrating feature is determined, and then a probability of failure of the component is calculated using a 2D probabilistic failure analysis of the stress concentration profile. The probabilistic failure analysis may include a Monte Carlo theta integration approach.Type: GrantFiled: June 25, 2014Date of Patent: January 2, 2018Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Kai Kadau, Christopher W. Ross, Chirag B. Patel, Christian Amann
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Patent number: 9711948Abstract: A terahertz source implementing a {hacek over (C)}erenkov difference-frequency generation scheme in a quantum cascade laser. The laser includes an undoped or semi-insulating InP substrate with an exit facet that is polished at an angle between 10° to 40°. The laser further includes a first waveguide cladding layer(s) in contact with an active layer (arranged as a multiple quantum well structure) and a current extraction layer on top of the substrate. Furthermore, the laser includes a second waveguide cladding layer(s) on top of the active layer, where the first and second waveguide cladding layers are disposed to form a waveguide structure by which terahertz radiation generated in the active layer is guided inside the laser. The terahertz radiation is emitted into the substrate at a {hacek over (C)}erenkov angle relative to a direction of the nonlinear polarization wave in the active layer, and once in the substrate, propagates towards the exit facet.Type: GrantFiled: July 24, 2013Date of Patent: July 18, 2017Assignee: Board of Regents, The University of Texas SystemInventors: Mikhail Belkin, Robert Adams, Markus Christian Amann, Augustinas Vizbaras
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Publication number: 20170153349Abstract: The disclosure relates to a locating system, comprising at least one hand-held locating sensor, which is provided for capturing locating data related to objects to be located that are hidden under an examination surface, a position sensor, which is provided for capturing position data, which can be associated with the locating data, and an evaluating unit, which is provided for determining at least two-dimensional map information from the locating data and the position data and providing said at least two-dimensional map information. According to the disclosure, the locating system comprises at least one data source, which is provided for providing data for the purpose of a modification of the at least two-dimensional map information.Type: ApplicationFiled: April 22, 2015Publication date: June 1, 2017Inventors: Reiner KRAPF, Heiko SGARZ, Jan-Michael BROSI, Christian AMANN, Ralph DAMMERTZ
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Publication number: 20170131426Abstract: An imaging locating device includes a first locating apparatus, a position sensor, and an evaluation apparatus. The first locating apparatus is configured to detect locating data in relation to objects to be located. The objects are concealed under an examination surface. The position sensor is configured to detect position data of the locating device in relation to the examination surface. The evaluation apparatus is configured to determine a first at least two-dimensional map information items by assigning the locating data of a first category from the first locating apparatus to the position data. The evaluation data is further configured to determine at least one further at least two-dimensional map information item. The at least one further at least two-dimensional map information item differs from the first at least two-dimensional map information item.Type: ApplicationFiled: June 25, 2015Publication date: May 11, 2017Applicant: Robert Bosch GmbHInventors: Heiko Sgarz, Jan-Michael Brosi, Tobias Zibold, Christian Amann, Sebastian Jackisch
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Publication number: 20170044995Abstract: A method for selecting operating points of a gas turbine while taking into consideration at least one controlled variable, the operating points being defined at least by parameter combinations of manipulated variables, wherein the operating points are automatically selected on the basis of already known parameter combinations by using an interpolation method, the Kriging interpolation method being used as the interpolation method.Type: ApplicationFiled: April 22, 2015Publication date: February 16, 2017Applicant: Siemens AktiengesellschaftInventors: Christian Amann, Björn Beckmann, Eberhard Deuker, Kai Kadau, Boris Ferdinand Kock, Georg Rollmann, Sebastian Schmitz, Marcel Zwingenberg
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Publication number: 20160308331Abstract: A terahertz source implementing a {hacek over (C)}erenkov difference-frequency generation scheme in a quantum cascade laser. The laser includes an undoped or semi-insulating InP substrate with an exit facet that is polished at an angle between 10° to 40°. The laser further includes a first waveguide cladding layer(s) in contact with an active layer (arranged as a multiple quantum well structure) and a current extraction layer on top of the substrate. Furthermore, the laser includes a second waveguide cladding layer(s) on top of the active layer, where the first and second waveguide cladding layers are disposed to form a waveguide structure by which terahertz radiation generated in the active layer is guided inside the laser. The terahertz radiation is emitted into the substrate at a {hacek over (C)}erenkov angle relative to a direction of the nonlinear polarization wave in the active layer, and once in the substrate, propagates towards the exit facet.Type: ApplicationFiled: July 24, 2013Publication date: October 20, 2016Applicant: Board of Regents, The University of Texas SystemInventors: Mikhail Belkin, Robert Adams, Markus Christian Amann, Augustinas Vizbaras
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Patent number: 9280620Abstract: A probabilistic estimation of fatigue crack life of a component is provided. A plurality of representations of the component is defined from material property scatter data and flaw-size scatter data, wherein each representation is defined by one possible material condition and flaw-size condition associated with the component. For each representation, a component location is selected and a determination is made whether said individual representation fails after a given number of cycles N, based on the calculation of a crack growth in the selected location. The crack growth is calculated on the basis of the material condition and the flaw-size condition in the selected location. Failure of the individual representation is determined if the crack growth is determined to be unstable. The sum total of the number of the representations that failed after N cycles is determined. A probability of failure of the component after N cycles is then determined.Type: GrantFiled: October 16, 2012Date of Patent: March 8, 2016Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Christian Amann, Phillip W. Gravett, Kai Kadau
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Publication number: 20150377766Abstract: A method for analyzing a three-dimensional stress concentrating feature of a component (60), such as a borehole (62), using a two-dimensional probabilistic technique. A circumferentially-dependent stress concentration profile around the stress concentrating feature is determined, and then a probability of failure of the component is calculated using a 2D probabilistic failure analysis of the stress concentration profile. The probabilistic failure analysis may include a Monte Carlo theta integration approach.Type: ApplicationFiled: June 25, 2014Publication date: December 31, 2015Inventors: Kai Kadau, Christopher W. Ross, Chirag B. Patel, Christian Amann
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Patent number: 8971375Abstract: The present invention relates to a surface-emitting laser diode with an active amplifying region (2) which is bounded by two laser mirrors (1, 3), while one or more polarization-selective layers (4) are provided for stabilizing the polarization in a region that is located on that side of at least one of the laser mirrors (1, 3) that is opposite the active amplifying region (2), these layers (4) extending parallel to the respective mirror (1; 3) and having a polarization-dependent refractive index and/or absorption.Type: GrantFiled: October 28, 2011Date of Patent: March 3, 2015Assignee: Vertilas, GmbHInventors: Markus-Christian Amann, Markus Ortsiefer, Jürgen Rosskopf
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Publication number: 20140358452Abstract: A method for estimating the crack length ãn+1 of at least one crack (2) in a component (1): At a first instant, the length ãn of the crack is determined and the length of the crack ãn+1=ãn+?ãn is estimated at a second instant by using the integration scheme a ~ n + 1 = a ~ n + d ? ? a ~ 1 6 + d ? ? a ~ 2 3 + d ? ? a ~ 3 3 + d ? ? a ~ 4 6 ( 17 ) d ? ? a ~ 1 = d ? ? Nf ? ( ? ? ? K n ) ( 18 ) d ? ? a ~ 2 = d ? ? Nf ? ( ? ? ? K n + 1 2 ? ? ? ? K n 2 ? ? a ~ n ? d ? ? a ~ 1 ) ( 19 ) d ? ? a ~ 3 = d ? ? Nf ? ( ? ? ? K n + 1 2 ? ? ? ? K n 2 ? ? a ~ n ? d ? ? a ~ 2 ) ( 20 ) d ? ? a ~ 4 = d ? ? Nf ? ( ? ? ? K n + ? ? ? K n 2 ? a ~ n ? d ? ? a ~ 3 ) , ( 21 ) with ?ãn designating the increase in the crack size, N designType: ApplicationFiled: May 20, 2014Publication date: December 4, 2014Applicant: SIEMENS AKTIENGESELLSCHAFTInventors: Christian AMANN, Kai KADAU
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Publication number: 20140349065Abstract: A layer system including a substrate and a layer is provided. The layer system has a hole at least in the layer, and wherein at least one recess is present in a surface of the layer in a vicinity around the hole or directly adjoining a boundary line of the hole.Type: ApplicationFiled: September 14, 2012Publication date: November 27, 2014Applicant: SIEMENS AKTIENGESELLSCHAFTInventors: Christian Amann, Thomas Beck, Bjorn Beckmann, Andreas Böttcher, Winfried Esser, Giuseppe Gaio, Rudolf Küperkoch, Eckart Schumann, Rostislav Teteruk
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Publication number: 20140295086Abstract: A process for producing a layer system is provided wherein the layer system has at least a substrate, a ceramic layer, which is applied to a surface structured in a targeted manner, in which process the intermediate layer, in particular the metallic layer, is applied in such a way that the recesses form during the coating. By introducing recesses into a surface, the stresses in the ceramic layer on the metallic substrate are reduced in such a manner that a longer lifespan for the ceramic layer is achieved.Type: ApplicationFiled: September 14, 2012Publication date: October 2, 2014Applicant: SIEMENS AKTIENGESELLSCHAFTInventors: Fathi Ahmad, Christian Amann, Bjorn Beckmann, Bjorn Buchholz, Giuseppe Gaio, Thomas Hille, Eckart Schumann, Rostislav Teteruk
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Publication number: 20140107948Abstract: A probabilistic estimation of fatigue crack life of a component is provided. A plurality of representations of the component is defined from material property scatter data and flaw-size scatter data, wherein each representation is defined by one possible material condition and flaw-size condition associated with the component. For each representation, a component location is selected and a determination is made whether said individual representation fails after a given number of cycles N, based on the calculation of a crack growth in the selected location. The crack growth is calculated on the basis of the material condition and the flaw-size condition in the selected location. Failure of the individual representation is determined if the crack growth is determined to be unstable. The sum total of the number of the representations that failed after N cycles is determined. A probability of failure of the component after N cycles is then determined.Type: ApplicationFiled: October 16, 2012Publication date: April 17, 2014Inventors: Christian Amann, Phillip W. Gravett, Kai Kadau
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Publication number: 20130336351Abstract: The present invention relates to a surface-emitting laser diode with an active amplifying region (2) which is bounded by two laser mirrors (1, 3), while one or more polarization-selective layers (4) are provided for stabilising the polarization in a region that is located on that side of at least one of the laser mirrors (1, 3) that is opposite the active amplifying region (2), these layers (4) extending parallel to the respective mirror (1; 3) and having a polarization-dependent refractive index and/or absorption.Type: ApplicationFiled: October 28, 2011Publication date: December 19, 2013Applicant: VERTILAS GmbHInventors: Markus-Christian Amann, Markus Ortsiefer, Jürgen Rosskopf