Patents by Inventor Christian Balderer

Christian Balderer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7769561
    Abstract: A method for monitoring machine conditions is based on machine learning through the use of a statistical model. A correlation coefficient is calculated using weights assigned to each sample that indicate the likelihood that that sample is an outlier. The resulting correlation coefficient is more robust against outliers. The calculation of the weight is based on the Mahalanobis distance from the sample to the sample mean. Additionally, hierarchical clustering is applied to intuitively reveal group information among sensors. By specifying a similarity threshold, the user can easily obtain desired clustering results.
    Type: Grant
    Filed: November 27, 2006
    Date of Patent: August 3, 2010
    Assignee: Siemens Corporation
    Inventors: Chao Yuan, Christian Balderer, Tzu-Kuo Huang, Claus Neubauer
  • Patent number: 7716152
    Abstract: A method is provided for selecting a representative set of training data for training a statistical model in a machine condition monitoring system. The method reduces the time required to choose representative samples from a large data set by using a nearest-neighbor sequential clustering technique in combination with a kd-tree. A distance threshold is used to limit the geometric size the clusters. Each node of the kd-tree is assigned a representative sample from the training data, and similar samples are subsequently discarded.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: May 11, 2010
    Assignee: Siemens Aktiengesellschaft
    Inventors: Christian Balderer, Claus Neubauer, Chao Yuan
  • Publication number: 20090043536
    Abstract: A method is provided for selecting a representative set of training data for training a statistical model in a machine condition monitoring system. The method reduces the time required to choose representative samples from a large data set by using a nearest-neighbor sequential clustering technique in combination with a kd-tree. A distance threshold is used to limit the geometric size the clusters. Each node of the kd-tree is assigned a representative sample from the training data, and similar samples are subsequently discarded.
    Type: Application
    Filed: March 14, 2008
    Publication date: February 12, 2009
    Inventors: Christian Balderer, Claus Neubauer, Chao Yuan
  • Publication number: 20070162241
    Abstract: A method for monitoring machine conditions is based on machine learning through the use of a statistical model. A correlation coefficient is calculated using weights assigned to each sample that indicate the likelihood that that sample is an outlier. The resulting correlation coefficient is more robust against outliers. The calculation of the weight is based on the Mahalanobis distance from the sample to the sample mean. Additionally, hierarchical clustering is applied to intuitively reveal group information among sensors. By specifying a similarity threshold, the user can easily obtain desired clustering results.
    Type: Application
    Filed: November 27, 2006
    Publication date: July 12, 2007
    Applicant: SIEMENS CORPORATE RESEARCH, INC.
    Inventors: Chao Yuan, Christian Balderer, Tzu-Kuo Huang, Claus Neubauer