Patents by Inventor Christian J. Hoehl

Christian J. Hoehl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11867668
    Abstract: The present disclosure describes systems and methods to correct for perspective calibration variations of a variable thickness specimen with a single camera extensometer in a video extensometer system. In some examples, the systems and methods compensate for a change between a reference characteristic, such as a calibration plane, and an actual physical characteristic, such as a testing plane associated with a surface of a test specimen, during a testing operation. In some examples, a correction value is applied to an output (e.g., measured dimensions of the imaged test specimen) to compensate for the difference between the reference characteristic and the physical characteristic.
    Type: Grant
    Filed: June 29, 2020
    Date of Patent: January 9, 2024
    Assignee: Illinois Tool Works Inc.
    Inventors: Christian J. Hoehl, Adrian Charles Riddick, Michael Ashman, Nicholas Francisco Salerno
  • Patent number: 11803943
    Abstract: The present disclosure describes systems and methods to correct for edge-position error associated with brightness levels of an associated back screen in a video extensometer system. In some examples, to correct for edge-position error, a processing system is configured to execute an edge detection algorithm to measure and/or calculate a difference between a perceived edge-position and a reference edge-position associated with an amount of error, and calculate a correction term to address the error. The correction term can be added to the result of the edge detection algorithm in case of white-to black transition, and subtracted in case of black-to-white transition to correct for the error.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: October 31, 2023
    Assignee: Illinois Tool Works Inc.
    Inventors: Christian J. Hoehl, Michael Ashman
  • Patent number: 11725932
    Abstract: The present disclosure describes systems and methods for conducting deformation (e.g., extension and/or strain) measurements based on characteristics of a test specimen using light sourced from a single side of a test specimen. The light source and an imaging device are arranged on a single side of the test specimen relative to a back screen while the light source illuminates both a front surface of the test specimen and the back screen. The back screen reflects light to create a silhouette of the test specimen. The imaging device captures images of one or more markers on a front surface of the test specimen, as well as measuring position of the markers during the testing process. The imaging device also measures relative changes in position of the edges of the test specimen during the testing process, by analyzing the edges of the silhouetted image created by the reflective back screen.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: August 15, 2023
    Assignee: Illinois Tool Works Inc.
    Inventors: Adrian Charles Riddick, Nicholas Francisco Salerno, Michael Ashman, Christian J. Hoehl
  • Publication number: 20210404929
    Abstract: The present disclosure describes systems and methods to correct for perspective calibration variations of a variable thickness specimen with a single camera extensometer in a video extensometer system. In some examples, the systems and methods compensate for a change between a reference characteristic, such as a calibration plane, and an actual physical characteristic, such as a testing plane associated with a surface of a test specimen, during a testing operation. In some examples, a correction value is applied to an output (e.g., measured dimensions of the imaged test specimen) to compensate for the difference between the reference characteristic and the physical characteristic.
    Type: Application
    Filed: June 29, 2020
    Publication date: December 30, 2021
    Inventors: Christian J. Hoehl, Adrian Charles Riddick, Michael Ashman, Nicholas Francisco Salerno
  • Publication number: 20200408509
    Abstract: The present disclosure describes systems and methods for conducting deformation (e.g., extension and/or strain) measurements based on characteristics of a test specimen using light sourced from a single side of a test specimen. The light source and an imaging device are arranged on a single side of the test specimen relative to a back screen while the light source illuminates both a front surface of the test specimen and the back screen. The back screen reflects light to create a silhouette of the test specimen. The imaging device captures images of one or more markers on a front surface of the test specimen, as well as measuring position of the markers during the testing process. The imaging device also measures relative changes in position of the edges of the test specimen during the testing process, by analyzing the edges of the silhouetted image created by the reflective back screen.
    Type: Application
    Filed: June 5, 2020
    Publication date: December 31, 2020
    Inventors: Adrian Charles Riddick, Nicholas Francisco Salerno, Michael Ashman, Christian J. Hoehl
  • Publication number: 20200410648
    Abstract: The present disclosure describes systems and methods to correct for edge-position error associated with brightness levels of an associated back screen in a video extensometer system. In some examples, to correct for edge-position error, a processing system is configured to execute an edge detection algorithm to measure and/or calculate a difference between a perceived edge-position and a reference edge-position associated with an amount of error, and calculate a correction term to address the error. The correction term can be added to the result of the edge detection algorithm in case of white-to black transition, and subtracted in case of black-to-white transition to correct for the error.
    Type: Application
    Filed: June 5, 2020
    Publication date: December 31, 2020
    Inventors: Christian J. Hoehl, Michael Ashman
  • Patent number: 10502552
    Abstract: The present disclosure provides an apparatus and method which uses a field splitter or a beam splitter for the purpose combining two different views of a materials testing sample under materials testing into a single image. This allows for three-dimensional strain measurement in the context of material/compound testing. In particular, the time and stress dependent change in gauge length can be tracked and calculated in order to calculate the time and stress dependent strain. The method and apparatus allows imaging on a single image sensor for the three-dimensional strain calculation.
    Type: Grant
    Filed: July 25, 2016
    Date of Patent: December 10, 2019
    Assignee: ILLINOIS TOOL WORKS INC.
    Inventors: Christian J. Hoehl, Martin A. Peterson, Roy D. Allen
  • Publication number: 20180216929
    Abstract: The present disclosure provides an apparatus and method which uses a field splitter or a beam splitter for the purpose combining two different views of a materials testing sample under materials testing into a single image. This allows for three-dimensional strain measurement in the context of material/compound testing. In particular, the time and stress dependent change in gauge length can be tracked and calculated in order to calculate the time and stress dependent strain. The method and apparatus allows imaging on a single image sensor for the three-dimensional strain calculation.
    Type: Application
    Filed: July 25, 2016
    Publication date: August 2, 2018
    Applicant: ILLINOIS TOOL WORKS INC.
    Inventors: Dr. Christian J. HOEHL, Martin A. PETERSON, Roy D. ALLEN