Abstract: An adjustable probe head consists of a probe head enclosing a plurality of test paths with a header that is attached to one of its opposing sides and electrically connected to the test paths. The header may be removably attached to the probe head. The probe head may enclose a board with an attached integrated circuit unit, and there may be a power cable and a signal cable connected to the board. There may be a clip that removably retains the probe head by releasably engaging with at least one of a plurality of slots on the sides of the probe head. The invention also includes a method of acquiring signals from an electrical device mounted on a test board. The electrical device may be a double data rate memory module.