Abstract: The invention relates to a method of testing an integrated circuit comprising memory cells arranged around a core whose clock input is subjected to a conditional inhibition in the test mode. The method in accordance with the invention includes the following steps: configuration of the circuit in the test mode (T/R=1, TM, En=0), selection of a virtual address (Sel(DV)), canceling the inhibition (En=1) of the clock input of the core following said selection. The invention enables to transfer to the core enough clock pulses to allow the core to properly achieve the operating sequence that it should emulate, without resorting to prior storage of the number of pulses necessary for this operating sequence. The inhibition of the clock input of the core can be controlled by means of JTAG-compliant series of instructions. Application: Validation of the functioning of integrated circuits.

Abstract: The invention relates to a method of testing an integrated circuit comprising memory cells arranged around a core whose clock input is subjected to a conditional inhibition in the test mode.

Abstract: The present invention comprises a smart debug interface circuit for the diagnostic testing and debugging of a software application for a programmable digital processor system. The smart debug interface circuit of the present invention includes an instruction register for coupling to an instruction bus of a programmable digital processor. The instruction register is adapted to drive instructions onto the instruction bus. The instruction register couples to the instruction bus in a parallel manner. The smart debug interface circuit of the present invention includes a data register for coupling to a data bus of the programmable digital processor. The data register is adapted to read data from the data bus and couples to the data bus in a parallel manner. The instruction register and data register are each coupled to an interface port. The interface port couples the smart debug interface circuit to a host computer system.

Abstract: The present invention comprises and interrupt controller for use with a programmable digital processor system. The interrupt controller of the present invention includes a plurality of interrupt blocks. The interrupt blocks are used for coupling to a corresponding plurality of peripheral devices. Each of the interrupt blocks are coupled to a data bus included within the interrupt controller. The interrupt controller also includes an interrupt control register. The interrupt control register is coupled to each of the interrupt blocks, and upon receiving an internal interrupt request from any of the interrupt blocks, asserts a processor interrupt request responsive to the internal interrupt request. The interrupt controller includes a processor interrupt request line adapted to couple to a programmable digital processor.

Abstract: The present invention comprises a smart debug interface circuit for the diagnostic testing and debugging of a software application for a programmable digital processor system. The smart debug interface circuit of the present invention includes an instruction register for coupling to an instruction bus of a programmable digital processor. The instruction register is adapted to drive instructions onto the instruction bus. The instruction register couples to the instruction bus in a parallel manner. The smart debug interface circuit of the present invention includes a data register for coupling to a data bus of the programmable digital processor. The data register is adapted to read data from the data bus and couples to the data bus in a parallel manner. The instruction register and data register are each coupled to an interface port. The interface port couples the smart debug interface circuit to a host computer system.

Abstract: This interpolative filter comprising N differentiating stages (4A-4N) constituting a section of low sampling frequency and N integrating stages (5A-5N) constituting a section of high sampling frequency is characterized in that is further comprises modulators (7A-7N) which are inserted into the string of integrators and which are intended to eliminate the increasing of the number of bits of the signal at each integration stage, and in that the said integrators are each included in a differentiation loop.